Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Guillaume Boetsch"'
Publikováno v:
International Symposium for Testing and Failure Analysis.
This work presents advanced resistance mapping techniques based on Scanning Electron Microscopy (SEM) with nanoprobing systems and the related embedded electronics. Focus is placed on recent advances to reduce noise and increase speed, such as integr
Publikováno v:
Procedia Chemistry. 1(1):1359-1362
We present a compact 3 degrees of freedom (dof) (X-Y-θz) absolute position sensor offering a sub-micrometric resolution. The travelling range is 15x15mm2 (translations) and ±180° (rotation), with an absolute precision better than 10μm over the wh
Autor:
Guillaume Boetsch, Maciej Rudek, Piotr Grabiec, Paweł Janus, Wojciech Majstrzyk, Teodor Gotszalk, Bernd Koehler, Daniel Kopiec, Andrzej Sierakowski
Publikováno v:
SPIE Proceedings.
In this article we describe a novel piezoresistive cantilever technology The described cantilever can be also applied in the investigations of the thermal surface properties in all Scanning Thermal Microscopy (SThM) techniques. Batch lithography/etch
Autor:
Volkmar Eichhorn, Sergej Fatikow, Christophe Canales, Ozlem Sardan, Reymond Clavel, Guillaume Boetsch, Daniel Jasper, Christian Stolle, Christoph Edeler, Peter Bøggild, Tim Wortmann
Publikováno v:
ICRA
Carbon nanotubes (CNTs) are one of the most promising materials for nanoelectronic applications. Before bringing CNTs into large-scale production, a reliable nanorobotic system for automated handling and characterization as well as prototyping of CNT
Autor:
J. H. Lee, G. Bringout, F. Cosandier, Reymond Clavel, Guillaume Boetsch, Christophe Canales, V. Chatagny
Publikováno v:
SPIE Proceedings.
This paper presents a complete manipulation platform for characterization of micro-components that is being developed in the scope of the European project GOLEM. Various tools such as electrical probes and force sensors have been designed and integra