Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Guenther Benstetter"'
Autor:
Lanlan Jiang, Jonas Weber, Francesco Maria Puglisi, Paolo Pavan, Luca Larcher, Werner Frammelsberger, Guenther Benstetter, Mario Lanza
Publikováno v:
Materials, Vol 12, Iss 3, p 459 (2019)
Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the prob
Externí odkaz:
https://doaj.org/article/141ea902fdfd4067856d9356e06d826b
Autor:
Kaichen Zhu, Sebastian Pazos, Fernando Aguirre, Yaqing Shen, Yue Yuan, Wenwen Zheng, Osamah Alharbi, Marco A. Villena, Bin Fang, Xinyi Li, Alessandro Milozzi, Matteo Farronato, Miguel Muñoz-Rojo, Tao Wang, Ren Li, Hossein Fariborzi, Juan B. Roldan, Guenther Benstetter, Xixiang Zhang, Husam N. Alshareef, Tibor Grasser, Huaqiang Wu, Daniele Ielmini, Mario Lanza
Publikováno v:
Nature. 618:57-62
Ministry of Science and Technology of China (grant nos. 2019YFE0124200 and 2018YFE0100800)
National Natural Science Foundation of China (grant no. 61874075)
Baseline funding scheme of the King Abdullah University of Science and Technology
National Natural Science Foundation of China (grant no. 61874075)
Baseline funding scheme of the King Abdullah University of Science and Technology
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a17f14f2540022e59a7a8e3fa96e4df
https://doi.org/10.1038/s41586-023-05973-1
https://doi.org/10.1038/s41586-023-05973-1
Autor:
Manuel Bogner, Tobias Berthold, Werner Frammelsberger, Rosana Rodriguez, Guenther Benstetter, Montserrat Nafria
Publikováno v:
Microelectronics Reliability. :383-389
In this work, we report on the protective effect of platinum and carbon based films deposited onto Cu surfaces subject to pre-bonding temperature stress. The protection of Cu surfaces is an important and advantageous procedure to improve the reliabil
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8a2ccfe6267c1b4ddfeb4ec3deae7630
https://doi.org/10.1016/j.microrel.2017.07.001
https://doi.org/10.1016/j.microrel.2017.07.001
Publikováno v:
Scanning
Scanning, Vol 2017 (2017)
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
Scanning, Vol 2017 (2017)
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona
For advanced atomic force microscopy (AFM) investigation of chemical surface modifications or very soft organic sample surfaces, the AFM probe tip needs to be operated in a liquid environment because any attractive or repulsive forces influenced by t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f204de2b16b91f2d432414b12771e1a6
https://doi.org/10.1155/2017/6286595
https://doi.org/10.1155/2017/6286595
Autor:
Tibor Grasser, Mario Lanza, Yuanyuan Shi, Xiaoxue Song, Guenther Benstetter, Yury Yu. Illarionov, Xu Jing, Enric Grustan-Gutierrez, Emanuel Panholzer, Fei Hui
Publikováno v:
Nano Energy. 30:494-502
During the last decade an unprecedented amount of funding has been invested on the study of the fundamental properties of two dimensional (2D) materials. Most of these studies have been mainly developed using research oriented techniques, such as mec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d57bf1d5e0291a9cd11aaf29658338a9
https://doi.org/10.1016/j.nanoen.2016.10.032
https://doi.org/10.1016/j.nanoen.2016.10.032
Publikováno v:
ACS applied materialsinterfaces. 11(17)
In this work, we monitor in situ the movement of ZnO piezoelectric nanowires by using a conductive atomic force microscope integrated into a scanning electron microscope. This setup allows seeing the bending of the nanowires and simultaneously measur
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::199309d97fab341ec6c98acbe3d301a8
https://pubmed.ncbi.nlm.nih.gov/30916549
https://pubmed.ncbi.nlm.nih.gov/30916549
Autor:
Guenther Benstetter, Jonas Weber, Paolo Pavan, Luca Larcher, Francesco Maria Puglisi, Werner Frammelsberger, Lanlan Jiang, Mario Lanza
Publikováno v:
Materials, Vol 12, Iss 3, p 459 (2019)
Materials; Volume 12; Issue 3; Pages: 459
Materials
Materials; Volume 12; Issue 3; Pages: 459
Materials
Conductive atomic force microscopy (CAFM) is one of the most powerful techniques in studying the electrical properties of various materials at the nanoscale. However, understanding current fluctuations within one study (due to degradation of the prob
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a45d7f9a6d0d7e8b619cb8d334699ff4
https://www.mdpi.com/1996-1944/12/3/459
https://www.mdpi.com/1996-1944/12/3/459
Autor:
Weiyuan Ni, Guangjiu Lei, Hongyu Fan, Dongping Liu, Yang Zhang, Guenther Benstetter, Lu Liu, Chunjie Niu, Yunqiu Cui
Publikováno v:
Plasma Physics and Controlled Fusion. 62:065002
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5fdf1276d80dce571e9a3d3cb0892646
https://doi.org/10.1088/1361-6587/ab8242
https://doi.org/10.1088/1361-6587/ab8242
Autor:
Montserrat Nafria, Tobias Berthold, Werner Frammelsberger, Rosana Rodriguez, Guenther Benstetter
Publikováno v:
Applied Surface Science. 356:921-926
In this study, we used Self-Assembled Monolayer (SAM) with CH 3 end-group molecules to protect copper surfaces from oxidation and investigated at nanometer scale the integrity and temperature stability of the protective film. The films were character
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::993c965421781276c46c114ef37dec77
https://doi.org/10.1016/j.apsusc.2015.08.182
https://doi.org/10.1016/j.apsusc.2015.08.182
Autor:
Rosana Rodriguez, Guenther Benstetter, Werner Frammelsberger, Tobias Berthold, Montserrat Nafria
Publikováno v:
Thin Solid Films. 584:310-315
In this work PeakForce Kelvin Probe Force Microscopy (PF-KPFM) at ambient environment is used to characterize both oxidation states of copper (Cu) surfaces, cupric oxide CuO and cuprous oxide Cu2O, with high lateral resolution. Characteristic values
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b7738e52c50c8b5c071ee72374e5f04f
https://doi.org/10.1016/j.tsf.2015.01.071
https://doi.org/10.1016/j.tsf.2015.01.071