Observation of the angular distribution of a x-ray characteristic emission through a periodic multilayer

Autor: Jonnard, Philippe, Wu, Meiyi, André, Jean-Michel, Guen, Karine Le, Wang, Zhanshan, Huang, Qiushi, Vickridge, Ian, Schmaus, Didier, Briand, Emrick, Steydli, Sébastien, Walter, Philippe

Publikováno v: Rev. Sci. Instrum. 89, 096109 (2018)

We present the observation of the angular distribution of a characteristic x-ray emission through a periodic multilayer. The emission coming from the substrate on which the multilayer is deposited is used for this purpose. It is generated upon proton

Externí odkaz: http://arxiv.org/abs/1809.10989

Kossel interferences of proton-induced X-ray emission lines in periodic multilayers

Autor: Wu, Meiyi, Guen, Karine Le, André, Jean-Michel, Ilakovac, Vita, Vickridge, Ian, Schmaus, Didier, Briand, Emrick, Steydli, Sébastien, Burcklen, Catherine, Bridou, Françoise, Meltchakov, Evgueni, De Rossi, Sébastien, Delmotte, Franck, Jonnard, Philippe

Publikováno v: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2016, 386 (1), pp.39 - 43

The Kossel interferences generated by characteristic x-ray lines produced inside a periodic multilayer have been observed upon proton irradiation, by submitting a Cr/B4C/Sc multilayer stack to 2 MeV protons and observing the intensity of the Sc and C

Externí odkaz: http://arxiv.org/abs/1612.02140

Interface observation of heat-treated Co/Mo2C multilayers

Autor: Yuan, Yanyan, Guen, Karine Le, André, Jean-Michel, Mény, Christian, Ulhaq, Corinne, Galtayries, Anouk, Zhu, Jingtao, Wang, Zhanshan, Jonnard, Philippe

Publikováno v: Applied Surface Science, Elsevier, 2015, 331, pp.8-16

We study the interface evolution of a series of periodic Co/Mo2C multilayers as a function of the annealing temperature up to 600{\textdegree}C. Different complementary techniques are implemented to get information on the phenomenon taking place at t

Externí odkaz: http://arxiv.org/abs/1501.07360

Characterization of Al and Mg Alloys from Their X-Ray Emission Bands

Autor: Jonnard, Philippe, Guen, Karine Le, Gauvin, R., Berre, Jean-François Le

Publikováno v: Microscopy and Microanalysis 15, 1 (2009) 36

The valence states of Mg-Al alloys are compared to those of reference materials (pure Mg and Al metals, and intermetallics). Two methods based on X-ray emission spectroscopy are proposed to determine the phases and their proportion: first, by analyzi

Externí odkaz: http://arxiv.org/abs/1307.3959

High-resolution x-ray analysis with multilayer gratings

Autor: Jonnard, Philippe, Guen, Karine Le, André, Jean-Michel

Publikováno v: X-Ray Spectrometry 38 (2008) 117-120

Periodic multilayers are nowadays widely used to perform x-ray analysis in the soft x-ray range (photon energy lower than 1 keV). However, they do not permit to obtain high-resolution spectra like natural or synthetic crystals. Thus, multilayers cann

Externí odkaz: http://arxiv.org/abs/1304.1777