Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Guangshan Duan"'
Publikováno v:
ITC
Accurate determination of the safe-fault failure rate of complex digital designs is an exascale problem. We present a novel measurement methodology and results which could have a profound impact on the performance and availability for GPUs in safety
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::889c8d964f2f9ca39df4d9f8f20d7829
https://doi.org/10.1109/itc44778.2020.9325239
https://doi.org/10.1109/itc44778.2020.9325239
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 23:1-18
Non-volatile memory technologies are among the most promising technologies for implementing the main memories and caches in future microprocessors and replacing the traditional DRAM and SRAM technologies. However, one of the most challenging design i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c00cb0fc13b8b78713b9814ed6f3b4b3
https://doi.org/10.1145/3084690
https://doi.org/10.1145/3084690
Autor:
Shuai Wang, Guangshan Duan
Publikováno v:
Microprocessors and Microsystems. 39:686-692
With continuous scaling down of the semiconductor technology, the soft errors induced by energetic particles have become an increasing challenge in designing current and next-generation reliable microprocessors. Due to their large share of the transi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2df462ce3717ea359b63fb26bdb612a
https://doi.org/10.1016/j.micpro.2015.09.011
https://doi.org/10.1016/j.micpro.2015.09.011
Autor:
Guangshan Duan, Shuai Wang
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d281975c7130fc83e448eed9b7639859
https://doi.org/10.7873/date.2014.065
https://doi.org/10.7873/date.2014.065
Publikováno v:
ACM Great Lakes Symposium on VLSI
The negative bias temperature instability (NBTI) in CMOS devices is one of most prominent sources of aging mechanisms, which can induce severe threats to the reliability of modern processors at deep submicron semiconductor technologies. Due to the un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a92077fe9f8a62574c76b5c0f31d243
https://doi.org/10.1145/2483028.2483096
https://doi.org/10.1145/2483028.2483096
Publikováno v:
Journal of Circuits, Systems and Computers. 25:1650115
The degradation of CMOS devices over the lifetime can cause severe threat to the system performance and reliability at deep submicron semiconductor technologies. The negative bias temperature instability (NBTI) is among the most important sources of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::365a1146e75e2b7f06e5e4f7bb7a2214
https://doi.org/10.1142/s0218126616501152
https://doi.org/10.1142/s0218126616501152
Publikováno v:
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::88b630c13294dc6bb52120544fde3e19
https://doi.org/10.1109/date.2012.6176528
https://doi.org/10.1109/date.2012.6176528