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pro vyhledávání: '"Guang Miao Wan"'
Publikováno v:
Materials Science Forum. 996:3-8
32in full high definition display devices based on back-channel etch IGZO TFTs were prepared. The mechanism of interlayer peeling defect in IGZO TFTs formation was studied. It turns out that the passivation layer was peeling with the underlying sourc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36aa436ab80f443021ed63bdaecf813d
https://doi.org/10.4028/www.scientific.net/msf.996.3
https://doi.org/10.4028/www.scientific.net/msf.996.3
