Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Guan Ruei Lu"'
Autor:
Guan Ruei Lu, Shiyan Hu, Katherine Shu-Min Li, Sying Jyan Wang, Chun Hao Kuo, Tsung-Yi Ho, Jian De Li, Hung-Ming Chen
Publikováno v:
Microelectronics Journal. 83:185-196
Digital microfluidic biochips (DMFBs) facilitate modern healthcare applications. One of the most important applications is point-of-care (POC) clinical diagnosis which is directly related to human ...
Publikováno v:
ACM Journal on Emerging Technologies in Computing Systems. 14:1-22
In the area of biomedical engineering, digital-microfluidic biochips (DMFBs) have received considerable attention because of their capability of providing an efficient and reliable platform for conducting point-of-care clinical diagnostics. System re
Autor:
Bhargab B. Bhattacharya, Hung-Ming Chen, Ansuman Banerjee, Kuen-Cheng Chiang, Guan-Ruei Lu, Chun-Hao Kuo, Tsung-Yi Ho
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 23:1-25
The active matrix (AM)-based architecture offers many advantages over conventional digital electrowetting-on-dielectric (EWOD) microfluidic biochips, such as the capability of handling variable-size droplets, more flexible droplet movement, and preci
Publikováno v:
2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC).
Autor:
Bhargab B. Bhattacharya, Tsung-Yi Ho, Ansuman Banerjee, Guan-Ruei Lu, Hung-Ming Chen, Guan-Ming Huang
Publikováno v:
ASP-DAC
In the area of biomedical engineering, digital-microfluidic biochips (DMFBs) have received considerable attention, because of their capability of providing an efficient and reliable platform for conducting point-of-care clinical diagnostics. System r
Publikováno v:
BioCAS
Digital microfluidic biochips maximize the possibilities in modern healthcare applications, such as point-of-care (POC) tests and immunoassays. Because of the error-prone biochemical experiments, cyber-physical digital microfluidic biochips with sens
Autor:
Guan-ruei Lu, 盧冠睿
101
In today’s nanometer IC process, process variation in devices is a common phenomenon. This process variation problem gets exponentially worse as device size shrinks, which will become a big issue in the future. If process variation changes
In today’s nanometer IC process, process variation in devices is a common phenomenon. This process variation problem gets exponentially worse as device size shrinks, which will become a big issue in the future. If process variation changes
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/73865196696174078566