Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Gruzman, I. S."'
Autor:
Gruzman, I. S.
Publikováno v:
Optoelectronics Instrumentation & Data Processing; Jul2018, Vol. 54 Issue 4, p321-327, 7p
Autor:
Aleksandrov, A. B., Zhukov, Yu. A., Vasyukov, V. N., Gruzman, I. S., Karlov, Yu. K., Marchenko, V. G., Spektor, A. A.
Publikováno v:
Russian Journal of Nondestructive Testing; Apr2004, Vol. 40 Issue 4, p233-238, 6p
Autor:
Gruzman, I. S.
Publikováno v:
2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE); 2012, p19-21, 3p
Autor:
McNamee, Antony P.1 (AUTHOR) mcnamee.ap@gmail.com, Simmonds, Michael J.1 (AUTHOR), Inoue, Masataka2 (AUTHOR), Horobin, Jarod T.3 (AUTHOR), Hakozaki, Masaya2 (AUTHOR), Fraser, John F.4 (AUTHOR), Watanabe, Nobuo2,5 (AUTHOR) nobuo@sic.shibaura-it.ac.jp
Publikováno v:
Scientific Reports. 12/7/2021, Vol. 11 Issue 1, p1-8. 8p.
Autor:
Getmanov, V. G.1,2 (AUTHOR) v.getmanov@gcras.ru, Chinkin, V. E.1 (AUTHOR), Sidorov, R. V.1 (AUTHOR), Gvishiani, A. D.1,2 (AUTHOR), Dobrovolsky, M. N.1 (AUTHOR), Soloviev, A. A.1,2 (AUTHOR), Dmitrieva, A. N.1,3 (AUTHOR), Kovylyaeva, A. A.1,3 (AUTHOR), Yashin, I. I.1,3 (AUTHOR)
Publikováno v:
Physics of Atomic Nuclei. Nov2021, Vol. 84 Issue 6, p1080-1086. 7p.
Autor:
SPIRIN, Anatolii, BORYSIUK, Dmytro, TSURKAN, Oleh, TVERDOKHLIB, Ihor, TRUKHANSKA, Olena, VESELOVSKA, Natalia
Publikováno v:
Przegląd Elektrotechniczny; 2023, Vol. 2023 Issue 10, p125-128, 4p
Autor:
Kozhemyakin, G. N.1 (AUTHOR) genakozhemyakin@mail.ru, Kiiko, S. A.2 (AUTHOR), Bryl, O. E.3 (AUTHOR)
Publikováno v:
Crystallography Reports. May2019, Vol. 64 Issue 3, p457-460. 4p.
Publikováno v:
International Journal of Computer Information Systems & Industrial Management Applications; 2023, Vol. 15, p469-478, 10p
Autor:
Ronzhin, An. ronzhin@iias.spb.su, Vatamanyuk, I. vatamaniuk@iias.spb.su, Ronzhin, Al. ronzhinal@iias.spb.su, Železnỳ, M.1 zelezny@kky.zcu.cz
Publikováno v:
Automation & Remote Control. Nov2015, Vol. 76 Issue 11, p2011-2020. 10p.
Publikováno v:
Russian Journal of Nondestructive Testing; 2020, Vol. 56 Issue 11, p915-926, 12p