Exploration of sustainability of micro grid grounding design in proximity to the pole grounding through experimental measurement of safety parameters

Autor: Krishnav Bhatia, Gauri Sarode

Publikováno v: e-Prime: Advances in Electrical Engineering, Electronics and Energy, Vol 7, Iss , Pp 100393- (2024)

Customarily, while designing the micro grid (MG) grounding the impact of close by grounding is not surmised. Due to which their grounding design becomes more flawed as it results in the fallacious computation of safety parameters, evincing the surplu

Externí odkaz: https://doaj.org/article/2f44b95d98364ca9986263bc126e97a9

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PENGARUH KELEMBABAN TANAH TERHADAP TAHANAN PENTANAHAN STUDI KASUS PADA GARDU INDUK KEMAYORAN 150 kV

Autor: Massus Subekti, Rahmawati Fajri Latiefa, Irzan Zakir

Publikováno v: Journal of Electrical Vocational Education and Technology; Vol 6 No 1 (2021): Journal Of Electrical Vocational Education and Technology; 44-49
Journal of Electrical Vocational Education and Technology; Vol 3 No 1 (2018): Journal Of Electrical Vocational Education and Technology; 18-23

The value of grounding resistance at the substation should be 0 Ω or less than 1 Ω. The value of grounding resistance is influenced by the resistivity and the grounding system method used. the resistivity is influenced by external factors, one of w

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a7e8a01dde33b9c726020e063b91c3ef
https://doi.org/10.21009/jevet.0031.04

Characteristics of Two Ground Grid Potentials After a Triggered Lightning Stroke

Autor: Shaodong Chen, Chen Lyuwen, Yijun Zhang, Xu Yan, Sai Du, Weitao Lyu

Publikováno v: IEEE Access, Vol 8, Pp 171001-171008 (2020)

It has been determined that the discharge of lightning current to ground through grounding grid results in high potential at the grounding grid and other nearby grounding grids, which is very destructive. In the present paper, based on artificially t

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e7133092391ac52348de4e67935b21b9
https://ieeexplore.ieee.org/document/9200337/