Impact of I-V behavior and estimated temperature rise on surface and tip modification of the nanocontact between a highly doped silicon scanning probe microscope tip and gold surface under ambient conditions.

Autor: Parkhi, Anjali, Gross, Todd S.

Publikováno v: Journal of Applied Physics; Jan2011, Vol. 109 Issue 1, p014323, 7p, 2 Color Photographs, 1 Black and White Photograph, 1 Diagram, 6 Graphs

Tension–compression anisotropy of in-plane elastic modulus for pyrolytic carbon

Autor: Gross, Todd S., Nguyen, Khanh, Buck, Michael, Timoshchuk, Nikolay, Tsukrov, Igor I., Reznik, Boris, Piat, Romana, Böhlke, Thomas

Publikováno v: In Carbon 2011 49(6):2145-2147

Nanoscale Observation of Dielectric Damage to Low k MSQ Interconnects from Reactive Ion Etching and Ash Treatment.

Autor: Gross, Todd S., Yao, Shaoning

Publikováno v: MRS Online Proceedings Library; 2005, Vol. 863 Issue 1, p1-5, 5p

In-situ measurements of three-dimensional displacement fields in shear crack growth using phase-shifted speckle interferometry.

Autor: Watt, David W., Goulet, Ronald U., Gross, Todd S.

Publikováno v: Proceedings of SPIE; Nov1995, Issue 1, p122-132, 11p

Detection of plasma-induced, nanoscale dielectric constant variations in carbon-doped CVD oxides by electrostatic force microscopy

Autor: Gross, Todd S, Soucy, Kevin G, Andideh, Ebrahim, Chamberlin, Kent

Publikováno v: Journal of Physics D: Applied Physics; April 7, 2002, Vol. 35 Issue: 7 p723-728, 6p