Automated near-field EMC/EMI scanning system with active electro-optical field probes.

Autor: Kuehn, Sven, Wild, Martin, Sepan, Peter, Grobelaar, Eugene, Kuster, Niels

Publikováno v: 2012 IEEE Electrical Design of Advanced Packaging & Systems Symposium (EDAPS); 1/ 1/2012, p109-112, 4p