Zobrazeno 1 - 10
of 49
pro vyhledávání: '"Grigore Moldovan"'
Publikováno v:
Agricultura, Vol 105, Iss 1-2 (2018)
The objective of this research was to determine the changes in quality of maize (Zea mays L.) seed in three years storage and in four genetically different Inbred Lines, during storage, under open storage conditions. The complexity of producing inbre
Externí odkaz:
https://doaj.org/article/011c3d8ee1d84408b396e0911bd87993
Publikováno v:
Agricultura, Vol 97, Iss 1-2 (2016)
The ageing process of corn seeds is an important economical and quality factor in corn growing, therefore the study of the impact of factors that influence the quality of the seeds during the storage period as well as their interaction has to be carr
Externí odkaz:
https://doaj.org/article/a6289e388e994fd98413bc40416eb346
Autor:
Grigore Moldovan, William Courbat
Publikováno v:
International Symposium for Testing and Failure Analysis.
The Electron Beam Induced Resistance Change (EBIRCH) technique is becoming more popular for localization of defects in Electrical Failure Analysis (EFA). Whilst EBIRCH is clear and straightforward in the procedure that must be followed for localizati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3a5153c9365fb0da8408f8a99e8d5db
https://doi.org/10.31399/asm.cp.istfa2022p0277
https://doi.org/10.31399/asm.cp.istfa2022p0277
Publikováno v:
Microscopy and Microanalysis. 28:1718-1719
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bb72e28754b254f78b661c43e176b63
https://doi.org/10.1017/s143192762200681x
https://doi.org/10.1017/s143192762200681x
Autor:
Grigore Moldovan, Michael Zabel
Publikováno v:
Microscopy and Microanalysis. 26:1176-1178
Experimental data, simulation, data analysis and visualisation require image file formats that are open source and able to contain and manage quantitative data. Quantification techniques bring the new challenge of managing image calibration parameter
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ab8995d62fdf6045c5e489d52aca4c7
https://doi.org/10.1017/s1431927620017225
https://doi.org/10.1017/s1431927620017225
Autor:
David Cooper, Minh Anh Luong, Grigore Moldovan, Eva Monroy, Martien Den Hertog, Aidan P. Conlan, Pascal Gentile
Publikováno v:
Nanotechnology
Nanotechnology, Institute of Physics, 2021, 33 (3), pp.035712. ⟨10.1088/1361-6528/ac2e73⟩
Nanotechnology, 2021, 33 (3), pp.035712. ⟨10.1088/1361-6528/ac2e73⟩
Nanotechnology, Institute of Physics, 2021, 33 (3), pp.035712. ⟨10.1088/1361-6528/ac2e73⟩
Nanotechnology, 2021, 33 (3), pp.035712. ⟨10.1088/1361-6528/ac2e73⟩
Here, we use electron beam induced current (EBIC) in a scanning transmission electron microscope to characterize the structure and electronic properties of Al/SiGe and Al/Si-rich/SiGe axial nanowire heterostructures fabricated by thermal propagation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5793b924636193bb5db8f1347c0ae17b
https://doi.org/10.1088/1361-6528/ac2e73
https://doi.org/10.1088/1361-6528/ac2e73
Publikováno v:
Journal of Applied Physics
Journal of Applied Physics, 2021, 129 (13), pp.135701. ⟨10.1063/5.0040243⟩
Journal of Applied Physics, American Institute of Physics, 2021, 129 (13), pp.135701. ⟨10.1063/5.0040243⟩
Journal of Applied Physics, 2021, 129 (13), pp.135701. ⟨10.1063/5.0040243⟩
Journal of Applied Physics, American Institute of Physics, 2021, 129 (13), pp.135701. ⟨10.1063/5.0040243⟩
International audience; A silicon p-n junction has been mapped using electron beam induced current in both a scanning transmission electron microscope (STEM) and a conventional scanning electron microscope (SEM). In STEM, the transmission of a higher
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e2852357ef9b4563a80a531cc0b08020
https://doi.org/10.1063/5.0040243
https://doi.org/10.1063/5.0040243
Publikováno v:
International Symposium for Testing and Failure Analysis.
This work presents advanced resistance mapping techniques based on Scanning Electron Microscopy (SEM) with nanoprobing systems and the related embedded electronics. Focus is placed on recent advances to reduce noise and increase speed, such as integr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::504549fd1abbd3d00d4498c24c4eb4a8
https://doi.org/10.31399/asm.cp.istfa2018p0353
https://doi.org/10.31399/asm.cp.istfa2018p0353
Publikováno v:
Microscopy of Semiconducting Materials 2003 ISBN: 9781351074636
The performance of Au / n-type GaN Schottky contacts is strongly dependent on the GaN surface processing prior to contacting. Current-voltage and EBIC line scans demonstrate that KOH treatment acts to degrade the Schottky contacts. EBIC imaging revea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1eea7fdd387b3fef09f0e379ac980bf8
https://doi.org/10.1201/9781351074636-130
https://doi.org/10.1201/9781351074636-130
Autor:
Grigore Moldovan
Publikováno v:
Microscopy and Microanalysis. 25:532-533
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3c491d7897609c72defc845e83f66921
https://doi.org/10.1017/s1431927619003398
https://doi.org/10.1017/s1431927619003398