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Autor:
Aristakes Hovsepyan, Grigor Harutyunyan, Vazgen Melikyan, Mkrtich Ishkhanyan, Tigran Hakobyan
Publikováno v:
2009 4th International Design and Test Workshop (IDT).
The purpose of this work is to add one more circuit into the PLL to define the lock condition. New types of PLL lock detectors, the principles of their operation, parametrical comparisons are presented. Presented circuits provide a simple design and