Výsledky vyhledávání - "Grepstad, Jon Olav"

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Neutral Helium Atom Diffraction from a Micron Scale Periodic Structure: Photonic Crystal Membrane Characterization

Autor: Nesse, Torstein, Eder, Sabrina D., Kaltenbacher, Thomas, Grepstad, Jon Olav, Simonsen, Ingve, Holst, Bodil

Publikováno v: Phys. Rev. A 95, 063618 (2017)

Surface scattering of neutral helium beams created by supersonic expansion is an established technique for measuring structural and dynamical properties of surfaces on the atomic scale. Helium beams have also been used in Fraunhofer and Fresnel diffr

Externí odkaz: http://arxiv.org/abs/1702.06601

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Dissertation/ Thesis

Tynnfilmepitaksi ved pulset laserdeponering av SrRuO3 : En vekstparameterstudie

Autor: Grepstad, Jon Olav

Tynnfilmepitaksi ved pulset laserdeponering av SrRuO3 på TiO2-terminert (001)-orientert SrTiO3-substrat, er i dette arbeidet undersøkt over et stort spekter av deponeringssystemets vekstparametere. Veksten er overvåket ved in situ målinger med el

Externí odkaz: http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-10392

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Total internal reflection and evanescent gain

Autor: Grepstad, Jon Olav, Skaar, Johannes

Publikováno v: Optics Express Vol. 19, Iss. 22, pp. 21404-21418 (2011)

Total internal reflection occurs for large angles of incidence, when light is incident from a high-refractive-index medium onto a low-index medium. We consider the situation where the low-index medium is active. By invoking causality in its most fund

Externí odkaz: http://arxiv.org/abs/1009.4592

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