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pro vyhledávání: '"Gregg, John Marty"'
Autor:
McCluskey, Conor J., Sharma, Niyorjyoti, Maguire, Jesi R., Pauly, Serene, Rogers, Andrew, Lindsay, TJ, Holsgrove, Kristina M., Rodriguez, Brian J., Soin, Navneet, Gregg, John Marty, McQuaid, Raymond G. P., Kumar, Amit
Kelvin probe microscopy (KPFM) is a well-established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena. In its conventional form, KPFM frustratingly precl
Externí odkaz:
http://arxiv.org/abs/2401.14124