Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Graham E. Wabiszewski"'
Publikováno v:
IEEE Nanotechnology Magazine. 9:18-24
The deficiency of existing electrical contact materials is currently a significant impediment to the commercialization of nanoelectromechanical (NEM) contact switches?a low-power ?beyond complementary metal-oxide semiconductor (CMOS) technology? [1].
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ebb01e7a57d211f00cb89671b151100d
https://doi.org/10.1109/mnano.2014.2373451
https://doi.org/10.1109/mnano.2014.2373451
Publikováno v:
The Review of scientific instruments. 87(1)
The nanoscale geometry of probe tips used for atomic force microscopy (AFM) measurements determines the lateral resolution, contributes to the strength of the tip-surface interaction, and can be a significant source of uncertainty in the quantitative
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::027ce71fc5fbb7fe4d87687eb5169092
https://pubmed.ncbi.nlm.nih.gov/26827324
https://pubmed.ncbi.nlm.nih.gov/26827324
Autor:
David S. Grierson, Graham E. Wabiszewski, Robert W. Carpick, Anirudha V. Sumant, Alex David Corwin, Andrew R. Konicek, M.P. de Boer
Publikováno v:
Tribology Letters. 36:233-238
Mechanisms of microscale wear in silicon-based microelectromechanical systems (MEMS) are elucidated by studying a polysilicon nanotractor, a device specifically designed to conduct friction and wear tests under controlled conditions. Photoelectron em
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c77a4847a238daf1cbd7c253a6de62d
https://doi.org/10.1007/s11249-009-9478-7
https://doi.org/10.1007/s11249-009-9478-7
Publikováno v:
14th IEEE International Conference on Nanotechnology.
Abstract—The deficiency of existing electrical contact materials is currently a significant impediment to the commercialization of nanoelectromechanical (NEM) contact switches - a low power "beyond CMOS technology". NEM switches utilizing tradi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be00a43fce539cbdbaa9280b21d7ff22
https://doi.org/10.1109/nano.2014.6967966
https://doi.org/10.1109/nano.2014.6967966
Publikováno v:
ADVANCED MATERIALS INTERFACES
F. Streller, Dr. F. Mangolini Department of Materials Science and Engineering University of Pennsylvania 3231 Walnut Street , Philadelphia , Pennsylvania 19104 , USA Dr. G. E. Wabiszewski, Dr. R. W. Carpick Department of Mechanical Engineering and Ap
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e542666c5331e5040e80536802eb51f6
https://eprints.whiterose.ac.uk/91821/1/AdvMat_Communication.pdf
https://eprints.whiterose.ac.uk/91821/1/AdvMat_Communication.pdf
Autor:
John Åhlund, B. Wannberg, Philip Egberts, Graham E. Wabiszewski, P G Karlsson, Vivek P Adiga, Robert W. Carpick, K. Backlund, Filippo Mangolini, Frank Streller
Publikováno v:
The Review of scientific instruments. 83(9)
The paper presents the development and demonstrates the capabilities of a new laboratory-based environmental X-ray photoelectron spectroscopy system incorporating an electrostatic lens and able to acquire spectra up to 0.4 Torr. The incorporation of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9527329f7bad2b3c7d072f940938de6f
https://pubmed.ncbi.nlm.nih.gov/23020367
https://pubmed.ncbi.nlm.nih.gov/23020367
Autor:
Robert W. Carpick, Valery V. Felmetsger, Nipun Sinha, Rashed Mahameed, Gianluca Piazza, Shawn M. Tanner, Graham E. Wabiszewski
Publikováno v:
TRANSDUCERS 2009 - 2009 International Solid-State Sensors, Actuators and Microsystems Conference.
This paper reports the first implementation of ultra thin (100 nm) Aluminum Nitride (AlN) piezoelectric layers for the fabrication of vertically deflecting nano-actuators. An average piezoelectric coefficient (d 31 ∼ − 1.9 pC/N) that is comparabl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0e12914511510bc08db8cf4139132ac
https://doi.org/10.1109/sensor.2009.5285460
https://doi.org/10.1109/sensor.2009.5285460
Autor:
Rashed Mahameed, Nipun Sinha, Graham E. Wabiszewski, Valery V. Felmetsger, Robert W. Carpick, Shawn M. Tanner, Gianluca Piazza
Publikováno v:
Applied Physics Letters. 95:053106
This letter reports the implementation of ultrathin (100 nm) aluminum nitride (AlN) piezoelectric layers for the fabrication of vertically deflecting nanoactuators. The films exhibit an average piezoelectric coefficient (d31∼−1.9 pC/N), which is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68e6164e51dee2fc847d1b5e2fb4635d
https://doi.org/10.1063/1.3194148
https://doi.org/10.1063/1.3194148