Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Graham B Winkelman"'
Autor:
David J. H. Cockayne, Duc Nguyen-Manh, Christian Dwyer, Toby S. Hudson, Markus Döblinger, Graham B Winkelman, Raphaelle Satet, Michael J. Hoffmann
Used in the preparation of Si3N4 components, rare-earth elements promote the growth of needlelike grains essential to elevated toughness; evidently, La is significantly more effective than Lu. To explore this difference, we determine the three-dimens
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f4390a0c9e869e413c85cc6bd3116bb6
https://doi.org/10.1063/1.2009067
https://doi.org/10.1063/1.2009067
Autor:
Christian Dwyer, Graham B Winkelman, Angus I. Kirkland, David J. H. Cockayne, Markus Döblinger, Michael J. Hoffmann, Chris Marsh
Two similarly processed yttrium oxide-doped Si3N4 ceramics containing differing amounts of amorphous phase are studied. Differences in the fracture mode of these two materials have been analysed structurally and compositionally by transmission electr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0f3ccb8f53f16cb79d85498871d8027d
https://doi.org/10.1016/j.acatamat.2005.12.016
https://doi.org/10.1016/j.acatamat.2005.12.016
Autor:
A. Ziegler, Stephen J. Pennycook, Paul F. Becher, Gayle S. Painter, Robert O. Ritchie, Christian Dwyer, Michael J. Hoffmann, Nagoya Shibata, Raphaelle Satet, Michael K. Cinibulk, Nigel D. Browning, Graham B Winkelman, David J. H. Cockayne
Publikováno v:
Journal of Materials Science. 41:4405-4412
Three independent research groups present a comparison of their structural analyses of prismatic interfaces in silicon nitride densified with the aid of lanthanide oxide Ln2O3. All three groups obtained scanning transmission electron microscope image
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::793635fdf28ebf77e7bb0e8ed1365379
https://doi.org/10.1007/s10853-006-0152-2
https://doi.org/10.1007/s10853-006-0152-2
Autor:
Markus Döblinger, Christian Dwyer, Graham B Winkelman, Toby S. Hudson, Duc Nguyen-Manh, Chris Marsh, David J. H. Cockayne
Publikováno v:
Materials Science and Engineering: A. 422:77-84
Internal interfaces are of intrinsic importance to the properties of all materials, and the link between their structure and properties continues to be an active field of research in materials science. Electron microscopy offers several techniques th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ecb04332b501aa472935e1f2fe04386a
https://doi.org/10.1016/j.msea.2006.01.003
https://doi.org/10.1016/j.msea.2006.01.003
Autor:
Michael J. Hoffmann, Graham B Winkelman, Christian Dwyer, David J. H. Cockayne, Toby S. Hudson, Raphaelle Satet, Markus Döblinger, Duc Nguyen-Manh
Publikováno v:
Philosophical Magazine Letters. 84:755-762
The arrangement of rare-earth atoms at {100} prism planes of La- and Lu-containing polycrystalline Si3N4 specimens is studied using high-angle annular dark-field scanning transmission electron microscopy. For both systems, the attachment sites of rar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e0a4f34455a8075a798520a23ebda5a6
https://doi.org/10.1080/09500830500041302
https://doi.org/10.1080/09500830500041302
Publikováno v:
Microscopy and Microanalysis. 12:136-137
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6f38b6160f7dc522c3e15bc877e9683
https://doi.org/10.1017/s1431927606069303
https://doi.org/10.1017/s1431927606069303
Autor:
Winkelman, Graham B., Dwyer, Christian, Hudson, Toby S., Nguyen-Manh, Duc, Döblinger, Markus, Satet, Raphaelle L., Hoffmann, Michael J., Cockayne, David J. H.
Publikováno v:
Applied Physics Letters; 8/8/2005, Vol. 87 Issue 6, p061911, 3p, 2 Diagrams, 1 Chart