Zobrazeno 1 - 10
of 6 492
pro vyhledávání: '"Graaf, H."'
Autor:
Chan, H. W., Prodanović, V., Theulings, A. M. M. G., Tao, S., Smedley, J., Hagen, C. W., Sarro, P. M., Graaf, H. v. d.
In this work we demonstrate that ultra-thin (5 and 15 nm) MgO transmission dynodes (tynodes) with sufficient high transmission electron yield (TEY) can be constructed. These tynodes act as electron amplification stages in a novel vacuum electron mult
Externí odkaz:
http://arxiv.org/abs/2304.09615
The effect of doping in Si3N4 membranes on the secondary electron yield is investigated using Monte Carlo simulations of the electron-matter interactions. The effect of the doping level of silicon doping and the effect of the distribution of the dopi
Externí odkaz:
http://arxiv.org/abs/2110.12965
Autor:
van Leeuwen-Stok, E., van Leeuwen, L., de Graaf, H., van Riel, J.M.G.H., Houtsma, D., Vrijaldenhoven, S., van der Velden, A.W.G., Peerdeman, A.L., van den Brink - Schimmel, R.J., Drooger, J.C., Imholz, A.L.Th., Dercksen, M.W., Oulad Hadj, J., Bakker, S.D., van der Wouw, A.J., Kerver, E.D., Bouma, G., van Schaik, C., de Boer, M., Mandigers, C.M.P.W., Koornstra, R.H.T., Smals, A., Rietbroek, R.C., van der Padt - Pruijsten, A., den Boer, M.O., Bos, H., Schiphorst, P.P.J.B.M., Vriens, B.E.P.J., van Rossum, Q.C., Tol, J., Hoogwerf - Kluft, D., Kruijtzer - Schimmel, C.M.F., Oosterkamp, H.M., Baas, I.O., Dietvorst, A.H.P., Davidis - van Schoonhoven, M., van Dijk, M.A., van der Voort, Anna, Louis, Fleur M, van Ramshorst, Mette S, Kessels, Rob, Mandjes, Ingrid A, Kemper, Inge, Agterof, Mariette J, van der Steeg, Wim A, Heijns, Joan B, van Bekkum, Marlies L, Siemerink, Ester J, Kuijer, Philomeen M, Scholten, Astrid, Wesseling, Jelle, Vrancken Peeters, Marie-Jeanne T F D, Mann, Ritse M, Sonke, Gabe S *
Publikováno v:
In The Lancet Oncology May 2024 25(5):603-613
Publikováno v:
J. Instrum. 15, P10022 (2020)
We measure the transmission secondary electron yield of nanometer-thick Al$_2$O$_3$/TiN/Al$_2$O$_3$ films using a prototype version of a Timed Photon Counter (TiPC). We discuss the method to measure the yield extensively. The yield is then measured a
Externí odkaz:
http://arxiv.org/abs/2010.12462