Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Grégoire R. N. Defoort-Levkov"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 14, Iss 1, Pp 834-849 (2023)
Ion beam processes related to focused ion beam milling, surface patterning, and secondary ion mass spectrometry require precision and control. Quality and cleanliness of the sample are also crucial factors. Furthermore, several domains of nanotechnol
Externí odkaz:
https://doaj.org/article/09e7e6ff8d9348d89a7006fdef71e39a
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 13, Iss 1, Pp 986-1003 (2022)
Focused ion beams (FIB) are a common tool in nanotechnology for surface analysis, sample preparation for electron microscopy and atom probe tomography, surface patterning, nanolithography, nanomachining, and nanoprinting. For many of these applicatio
Externí odkaz:
https://doaj.org/article/90b9da7486b14b8e8c576b439e130f17
Ion beam processes related to focused ion beam (FIB) milling, surface patterning and secondary ion mass spectrometry (SIMS) require precision and control, the quality and cleanliness of the sample being a detrimental factor. Furthermore, several doma
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19d33299e7273d250a1c6ec4695fd30b
https://doi.org/10.3762/bxiv.2023.8.v1
https://doi.org/10.3762/bxiv.2023.8.v1
