Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Gou Andou"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :933-937
The production process of secondary electrons at a LiF(0 0 1) surface is investigated utilizing specular reflection of 0.5 MeV protons. From the observed secondary-electron yield, the position-dependent secondary-electron production rate is derived.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b49a11dacf9d34450d2e0e7adbe1b055
https://doi.org/10.1016/s0168-583x(99)01126-x
https://doi.org/10.1016/s0168-583x(99)01126-x
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 160:16-20
Secondary electron yield induced by 0.5 MeV protons reflected from a KCl(0 0 1) surface is measured at various incident azimuthal angles around the [1 0 0] direction. The observed secondary electron yield shows enhancement under surface channeling co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c3d32f98ac2737c39109d6b50487995
https://doi.org/10.1016/s0168-583x(99)00572-8
https://doi.org/10.1016/s0168-583x(99)00572-8
Publikováno v:
Physical Review Letters. 81:5438-5441
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d1ebe75a34de9ac85f8deab622fce15e
https://doi.org/10.1103/physrevlett.81.5438
https://doi.org/10.1103/physrevlett.81.5438
Publikováno v:
Physical Review A. 58:1282-1286
Secondary-electron yield induced by MeV protons specularly reflected from a SnTe(001) surface is measured. From the observed secondary-electron yield, the position-dependent secondary-electron production rate $P(x)$ is derived as a function of distan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18f5b35df94fd882322bd2625993d8e6
https://doi.org/10.1103/physreva.58.1282
https://doi.org/10.1103/physreva.58.1282
Publikováno v:
PHYSICAL REVIEW A. 61
We have measured the secondary-electron (SE) yield in coincidence with 1\char21{}2-MeV ${\mathrm{He}}^{+,2+}$ ions reflected from a SnTe(001) at grazing incidence. Specific ion trajectories, i.e., true specular reflection and subsurface channeling, c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c52b8b64875f201e5373b0676083d6af
http://hdl.handle.net/2433/34824
http://hdl.handle.net/2433/34824
Publikováno v:
AIP Conference Proceedings.
The production process of secondary electrons at surface is investigated utilizing specular reflection of MeV protons at SnTe(001) and KCl(001) surfaces. The secondary-electron yield induced by 0.5-MeV protons specularly reflected from SnTe(001) is a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b9393cd32abed577afbd0ca7a9ae6f6
https://doi.org/10.1063/1.59131
https://doi.org/10.1063/1.59131