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Atomic force microscopy in mechanical measurements of single nanowires.

Autor: Pruchnik BC; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland., Fidelus JD; Time and Length Department, Central Office of Measures, Elektoralna 2, Warsaw 00-139, Poland. Electronic address: janusz.fidelus@gum.gov.pl., Gacka E; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland., Mika K; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Zaraska L; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Sulka GD; Department of Physical Chemistry and Electrochemistry Department, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, Kraków 30-387, Poland., Gotszalk TP; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, Wrocław 50-370, Poland.

Publikováno v: Ultramicroscopy [Ultramicroscopy] 2024 Sep; Vol. 263, pp. 113985. Date of Electronic Publication: 2024 May 07.

Four-Point Measurement Setup for Correlative Microscopy of Nanowires.

Autor: Pruchnik BC; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Fidelus JD; Time and Length Department, Central Office of Measures, Elektoralna 2, 00-139 Warsaw, Poland., Gacka E; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Kwoka K; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Pruchnik J; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Piejko A; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Usydus Ł; Electricity and Radiation Department, Central Office of Measures, Elektoralna 2, 00-139 Warsaw, Poland., Zaraska L; Department of Physical Chemistry and Electrochemistry, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, 30-387 Krakow, Poland., Sulka GD; Department of Physical Chemistry and Electrochemistry, Faculty of Chemistry, Jagiellonian University, Gronostajowa 2, 30-387 Krakow, Poland., Piasecki T; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland., Gotszalk TP; Department of Nanometrology, Wrocław University of Science and Technology, Janiszewskiego 11/17, 50-370 Wroclaw, Poland.

Publikováno v: Nanomaterials (Basel, Switzerland) [Nanomaterials (Basel)] 2023 Aug 30; Vol. 13 (17). Date of Electronic Publication: 2023 Aug 30.

Layer number dependence of the work function and optical properties of single and few layers MoS 2 : effect of substrate.

Autor: Tamulewicz M; Faculty of the Microsystems Electronics and Photonics, Wroclaw University of Science and Technology, Wroclaw, Poland., Kutrowska-Girzycka J, Gajewski K, Serafińczuk J, Sierakowski A, Jadczak J, Bryja L, Gotszalk TP

Publikováno v: Nanotechnology [Nanotechnology] 2019 Jun 14; Vol. 30 (24), pp. 245708. Date of Electronic Publication: 2019 Mar 05.