Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Gosse de Vries"'
Autor:
Eric Louis, Sven Toleikis, Jaromír Chalupský, Gosse de Vries, Iwanna Jacyna, Frank Siewert, Hartmut Enkisch, Barbara Keitel, Libor Juha, Karel Saksl, Dorota Klinger, Martin Hermann, V. Vozda, Ryszard Sobierajski, Sebastian Strobel, Věra Hájková, Igor Alexandrovich Makhotkin, Marek Jurek, Tomáš Burian, Zdeněk Zelinger, R.A. Loch, Elke Plönjes, Kai Tiedtke, Bart Faatz
Publikováno v:
Optics express, 28(18), 25664-25681. The Optical Society
Optics express 28(18), 25664-25681 (2020). doi:10.1364/OE.396755
Optics express 28(18), 25664-25681 (2020). doi:10.1364/OE.396755
Optics express 28(18), 25664-25681 (2020). doi:10.1364/OE.396755
Proper diagnostics of intense free-electron laser (FEL) X-ray pulses is indisputably important for experimental data analysis as well as for the protection of beamline optical elem
Proper diagnostics of intense free-electron laser (FEL) X-ray pulses is indisputably important for experimental data analysis as well as for the protection of beamline optical elem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::46ad76c32f222a696cc0133cbb5903d2
http://www.scopus.com/inward/record.url?scp=85090382763&partnerID=8YFLogxK
http://www.scopus.com/inward/record.url?scp=85090382763&partnerID=8YFLogxK
Autor:
Igor Alexandrovich Makhotkin, Jaromír Chalupský, Dorota Klinger, Ryszard Sobierajski, Libor Juha, Marek Jurek, Elke Plönjes, Iwanna Jacyna, Karel Saksl, Sebastian Strobel, Michael Störmer, Frank Siewert, Kai Tiedtke, Eric Louis, Barbara Keitel, Igor Milov, Věra Hájková, Tobias Mey, Laurent Nittler, R.A. Loch, Gosse de Vries, Sven Toleikis, Martin Hermann, Siegfried Schreiber, Y. Syryanyy, Tomáš Burian, Han Kwang Nienhuys, Hartmut Enkisch, Grzegorz Gwalt, Bart Faatz, V. Vozda, Robbert Wilhelmus Elisabeth van de Kruijs, Frank Scholze
Publikováno v:
Journal of synchrotron radiation 25(1), 77-84 (2018). doi:10.1107/S1600577517017362
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography
Journal of synchrotron radiation 25(1), 77 - 84 (2018). doi:10.1107/S1600577517017362
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3db3625e434f17702e7c6f075fcc8a20
https://doi.org/10.1107/s1600577517017362
https://doi.org/10.1107/s1600577517017362
Autor:
Dorota Klinger, Marek Jurek, Igor Alexandrovich Makhotkin, Karel Saksl, Michael Störmer, Jerzy B. Pelka, Eric Louis, Sven Toleikis, Vojtech Vozda, Marion Kuhlmann, Iwanna Jacyna, Tomáš Burian, Siegfried Schreiber, Sebastian Strobel, Jaromír Chalupský, Hartmut Enkisch, Mabel Ruiz-Lopez, Frank Siewert, Barbara Keitel, Thomas Wodzinski, Martin Hermann, Vera Hájková, R.A. Loch, Gosse de Vries, Libor Juha, Elke Plönjes, Kai Tiedtke, Tobias Mey, Ryszard Sobierajski, Frank Scholze
Publikováno v:
Optics Damage and Materials Processing by EUV/X-ray Radiation VII.
An accurate transmission measurement of thin foils (usually made of elemental metals and/or semiconductors), which routinely are used as attenuators in soft x-ray beamlines, end-stations and instruments, represents a long standing problem over the wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cbe59645973d80dc96a4a15de0687346
https://doi.org/10.1117/12.2524718
https://doi.org/10.1117/12.2524718
Autor:
Robbert Wilhelmus Elisabeth van de Kruijs, Gosse de Vries, Libor Juha, Iwanna Jacyna, Marek Jurek, Dorota Klinger, M.A. Smithers, Frank Scholze, Sebastian Strobel, Tomáš Burian, Hartmut Enkisch, Eric Louis, Karel Saksl, Barbara Keitel, Sven Toleikis, Martin Hermann, Siegfried Schreiber, Jerzy B. Pelka, V. Vozda, Konstantin Nikolaev, Henk van Wolferen, Bart Faatz, Elke Plönjes, Ryszard Sobierajski, R.A. Loch, Enrico G. Keim, Rilpho Ludovicus Donker, Frank Siewert, Igor Alexandrovich Makhotkin, Igor Milov, Tobias Mey, Kai Tiedtke, Jaromír Chalupský, Jacobus Marinus Sturm, Věra Hájková
Publikováno v:
Journal of the Optical Society of America. B: Optical physics, 35(11), 2799-2805. Optica Publishing Group
The process of damage accumulation in thin ruthenium films exposed to multiple femtosecond extreme ultraviolet (XUV) free-electron laser (FEL) pulses below the critical angle of reflectance at the FEL facility in Hamburg (FLASH) was experimentally an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::07e1a215a062e4a4fc0445c3f6b012e8
https://research.utwente.nl/en/publications/eed0f8e1-4757-4ead-a45f-61cc77928423
https://research.utwente.nl/en/publications/eed0f8e1-4757-4ead-a45f-61cc77928423
Autor:
Frank Siewert, Iwanna Jacyna, Jaromír Chalupský, Robbert Wilhelmus Elisabeth van de Kruijs, Nikita Medvedev, Ryszard Sobierajski, Elke Plönjes, Igor Alexandrovich Makhotkin, Fred Bijkerk, Barbara Keitel, R.A. Loch, Gosse de Vries, V. Vozda, Bart Faatz, Han-Kwang Nienhuys, Tomáš Burian, Grzegorz Gwalt, Igor Milov, Tobias Mey, Eric Louis, Siegfried Schreiber, Sebastian Strobel, Martin Hermann, Michael Störmer, Jacobus Marinus Sturm, Věra Hájková, Kai Tiedtke, Hartmut Enkisch, Karel Saksl, Sven Toleikis, Vladimir Lipp, Marek Jurek, Libor Juha
Publikováno v:
Optics express 26(15), 19665-19685 (2018). doi:10.1364/OE.26.019665
Optics express, 26(15), 19665-19685. The Optical Society
Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupský, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. In: Optics express. Vol. 26 (2018) 15, 19665-19685. (DOI: /10.1364/OE.26.019665)
Optics express, 26(15), 19665-19685. The Optical Society
Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupský, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. In: Optics express. Vol. 26 (2018) 15, 19665-19685. (DOI: /10.1364/OE.26.019665)
Optics express 26(15), 19665 - 19685 (2018). doi:10.1364/OE.26.019665
Ruthenium is a perspective material to be used for XUV mirrors at free-electron laser facilities. Yet, it is still poorly studied in the context of ultrafast laser-matter inte
Ruthenium is a perspective material to be used for XUV mirrors at free-electron laser facilities. Yet, it is still poorly studied in the context of ultrafast laser-matter inte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44c9434c6e13568444356468d4132f4e
Autor:
Igor Milov, Igor Alexandrovich Makhotkin, Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., Gosse de Vries, Scholze, F., Siewert, F., Störmer, M., Robbert van de Kruijs, Keim, E. G., Wolferen, Hendricus A. G. M., Yatsyna, I., Jurek, M., Juha, L., Hajkova, V., Vozda, V., Burian, T., Saksl, K., Faatz, B., Keitel, B., Ploenjes, E., Schreiber, S., Toleikis, S., Loch, R. A., Hermann, M., Strobel, S., Nienhuys, H., Eric Louis, Frederik Bijkerk
Publikováno v:
None
University of Twente Research Information (Pure Portal)
University of Twente Research Information (Pure Portal)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::2c4d4b4ef5db5093764951b6b8d42824
https://research.utwente.nl/en/publications/singleshot-damage-of-ru-thin-film-induced-by-fel-fs-pulses(4e81dec9-af49-4ff3-bff1-c1709d82285f).html
https://research.utwente.nl/en/publications/singleshot-damage-of-ru-thin-film-induced-by-fel-fs-pulses(4e81dec9-af49-4ff3-bff1-c1709d82285f).html
Autor:
Igor Milov, Igor Alexandrovich Makhotkin, Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., Gosse de Vries, Scholze, F., Siewert, F., Störmer, M., Robbert van de Kruijs, Keim, R., Wolferen, Hendricus A. G. M., Yatsyna, I., Jurek, M., Juha, L., Hajkova, V., Vozda, V., Burian, T., Saksl, K., Faatz, B., Keitel, B., Ploenjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Nienhuys, H., Eric Louis, Frederik Bijkerk
Publikováno v:
Physics of X-Ray and Neutron Multilayer Structures workshop 2016
University of Twente Research Information (Pure Portal)
University of Twente Research Information (Pure Portal)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4565db1205705ce0c0385439d775ef2a
https://research.utwente.nl/en/publications/nonequilibrium-electronphonon-dynamics-in-ruthenium-thin-films-exposed-to-ultrashort-laser-pulses(0df24dd5-5b8f-4a7b-8906-481fe9b054a7).html
https://research.utwente.nl/en/publications/nonequilibrium-electronphonon-dynamics-in-ruthenium-thin-films-exposed-to-ultrashort-laser-pulses(0df24dd5-5b8f-4a7b-8906-481fe9b054a7).html
Autor:
Makhotkin, Igor A.1 i.makhotkin@utwente.nl, Sobierajski, Ryszard2, Chalupský, Jaromir3, Tiedtke, Kai4, de Vries, Gosse5, Störmer, Michael6, Scholze, Frank7, Siewert, Frank8, van de Kruijs, Robbert W. E.1, Milov, Igor1, Louis, Eric1, Jacyna, Iwanna2, Jurek, Marek2, Klinger, Dorota2, Nittler, Laurent2, Syryanyy, Yevgen2, Juha, Libor3,9, Hájková, Věra3, Vozda, Vojtěch3,10, Burian, Tomáš3,9
Publikováno v:
Journal of Synchrotron Radiation. Jan2018, Vol. 25 Issue 1, p77-84. 8p.
Autor:
Sakhonenkov, Sergei S., Filatova, Elena O., Gaisin, Aidar U., Kasatikov, Sergey A., Konashuk, Aleksei S., Pleshkov, Roman S., Chkhalo, Nikolay I.
Publikováno v:
Physical Chemistry Chemical Physics (PCCP); 12/7/2019, Vol. 21 Issue 45, p25002-25010, 9p
Publikováno v:
Proceedings of SPIE; 6/30/2023, Vol. 12578, p125780E-125780E-6, 1p