Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Gopinath Ranganathan"'
Publikováno v:
Indian Journal of Anaesthesia, Vol 67, Iss 5, Pp 463-466 (2023)
Externí odkaz:
https://doaj.org/article/5346f4cdfdc0497899223db15e6041af
Autor:
V. K. Ravikumar, Jiann Min Chin, Winson Lua, Nathan Linarto, Gopinath Ranganathan, Jonathan Trisno, K. L. Pey, Joel K. W. Yang
Publikováno v:
Nature Communications, Vol 13, Iss 1, Pp 1-8 (2022)
Laser probing of integrated circuits using sub-bandgap photon energies remains a challenge. Here, the authors propose a super-resolution method capable of achieving probe placement accuracy to better than 10 nm; extraction of electro-optic waveforms
Externí odkaz:
https://doaj.org/article/a0f43b1fc1c741128dc262efb368d7f7
Publikováno v:
EDFA Technical Articles. 20:10-16
This article explains how laser voltage probing (LVP) can be used to analyze combinational logic circuits. The authors describe how the technique is aided by the development and use of a waveform library and a corresponding truth table. They also pre
Publikováno v:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Analog circuits are traditionally harder to debug using light assisted device alteration (LADA) also known as dynamic laser stimulation (DLS), as the circuitry are too sensitive to carrier generations. This paper showcases a successful post-silicon d
Autor:
Tan Abel, Phoa Angeline, Ravikumar Venkat Krishnan, Seah Yi Xuan, Chua Choon Meng, Gopinath Ranganathan, Lim Gabriel, Lua Winson
Publikováno v:
International Symposium for Testing and Failure Analysis.
Combinational logic analysis (CLA) using laser voltage probing allows studying standard cells such as NOR or NAND gates as a whole, instead of individual transistors. The process involves building a reference library of laser probing (LP) waveforms a
Autor:
Angeline Phoa, Venkat Krishnan Ravikumar, Abel Tan, Winson Lua, A S Girish, Gopinath Ranganathan
Publikováno v:
Microelectronics Reliability. 106:113584
Analog circuits are often challenging to debug with dynamic laser stimulation (DLS) due to intrinsic sensitivity of some circuitries to carrier generations. This paper showcases successful post‑silicon debug on analog circuitries (start-up circuit)
Publikováno v:
2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Combinational logic analysis has been introduced to improve fault isolation when using laser voltage probing on standard cells. The technique has been shown to offer more reliable isolation within a shorter time thereby increasing FI efficiency. This
Publikováno v:
International Symposium for Testing and Failure Analysis.
Laser Voltage Probing (LVP) using continuous-wave near infra-red lasers are popular for failure analysis, design and test debug. LVP waveforms provide information on the logic state of the circuitry. This paper aims to explain the waveforms observed
Publikováno v:
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
1320 nm Continuous Wave (CW) laser is conventionally used for Timing Analysis techniques like Laser voltage probing which has spatial resolution limitation as the technology node scales down. This paper illustrates case studies using 1064 nm CW laser