Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Golnaz Korkian"'
Autor:
Golnaz Korkian, Daniel Leon, Francisco J. Franco, Juan C. Fabero, Manon Letiche, Yolanda Morilla, Pedro Martin-Holgado, Helmut Puchner, Hortensia Mecha, Juan A. Clemente
Publikováno v:
IEEE Access, Vol 10, Pp 114566-114585 (2022)
In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The-Shelf (COTS) memories and emerging technology devices. This pape
Externí odkaz:
https://doaj.org/article/9c97a649282a493bbd577d86bea1e8ee
Autor:
Francisco J. Franco, Hortensia Mecha, Raoul Velazco, Golnaz Korkian, Juan Antonio Clemente, Juan Carlos Fabero
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
instname
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
In radiation tests on SRAMs or field-programmable gate arrays (FPGAs), two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests, such as the “birthday statistics
SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles
Autor:
Juan C. Fabero, Golnaz Korkian, Francisco J. Franco, Guillaume Hubert, Hortensia Mecha, Manon Letiche, Juan A. Clemente
Publikováno v:
Microprocessors and Microsystems. 96:104743
This paper provides an experimental study of the single-event upset (SEU) susceptibility against thermal neutron radiation of a 28-nm bulk Commercial-Off-The-Shelf (COTS) Xilinx Artix-7 FPGA under different angles of incidence. Experimental results i
Autor:
Juan C. Fabero, Golnaz Korkian, Francisco J. Franco, Hortensia Mecha, Manon Letiche, Juan A. Clemente
Publikováno v:
2021 IEEE 22nd Latin American Test Symposium (LATS).
Autor:
Hortensia Mecha, Juan Antonio Clemente, Helmut Puchner, Francisco J. Franco, Guillaume Hubert, Juan Carlos Fabero, Mohammadreza Rezaei, Golnaz Korkian
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (11), pp.2345-2352. ⟨10.1109/TNS.2020.3025104⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
instname
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (11), pp.2345-2352. ⟨10.1109/TNS.2020.3025104⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
International audience; In harsh radiation environments, it is well known that the angle of incidence of impinging particles against the surface of the operating devices has significant effects on their sensitivity. This article discusses the sensiti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::406ff9d2177cedf973889cfeecde1caf
Autor:
B. Cheymol, Francisco J. Franco, Guillaume Hubert, Raoul Velazco, Hortensia Mecha, Maud Baylac, Solenne Rey, Golnaz Korkian, Juan Antonio Clemente, Juan Carlos Fabero
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1461-1469. ⟨10.1109/TNS.2020.2977874⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
instname
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1461-1469. ⟨10.1109/TNS.2020.2977874⟩
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
International audience; A sensitivity characterization of a Xilinx Artix-7 field programmable gate array (FPGA) against 14.2-MeV neutrons is presented. The content of the internal static random access memories (SRAMs) and flip-flops was downloaded in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7bab2f02eab26f83ebe1c1da7543c2c2
https://eprints.ucm.es/59496/
https://eprints.ucm.es/59496/
Publikováno v:
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
E-Prints Complutense. Archivo Institucional de la UCM
instname
Universidad Complutense de Madrid
E-Prints Complutense. Archivo Institucional de la UCM
instname
During the last decades, technology scaling in reconfigurable logic devices enabled implementing complicated designs which results in higher power density and on-chip temperature. Since higher operating temperature of chips is a critical problem in e
Autor:
Golnaz Korkian, Daniel Leon, Francisco J. Franco, Juan C. Fabero, Manon Letiche, Yolanda Morilla, Pedro Martin-Holgado, Helmut Puchner, Hortensia Mecha, Juan A. Clemente
Publikováno v:
IEEE Access. 10:114566-114585
In New Space, the need for reduced cost, higher performance, and more prompt delivery plans in radiation-harsh environments have motivated spacecraft designers to use Commercial-Off-The- Shelf (COTS) memories and emerging technology devices. This pap