Zobrazeno 1 - 10
of 71
pro vyhledávání: '"Golden wafers"'
Publikováno v:
MEMS Product Development
In this chapter, we provide details regarding the steps of technology transfer in the context of working with a MEMS wafer foundry. The best practices and guidelines we describe, however, also apply to transferring any component to a third-party volu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmc_________::dbd1d1495eb5f9ecca0752fcb82ecd06
http://europepmc.org/articles/PMC7972085
http://europepmc.org/articles/PMC7972085
A Method of Relative Calibration Developed for very High Consistency of Internal Metrology Standards
Autor:
Yang, Siyuan F.
Publikováno v:
ECS Transactions; March 2012, Vol. 44 Issue: 1 p1117-1122, 6p
Publikováno v:
2007 International Symposium on Semiconductor Manufacturing; 2007, p1-4, 4p
Autor:
Zannoni, M.1
Publikováno v:
International Journal of Numerical Modelling. Nov/Dec2015, Vol. 28 Issue 6, p745-754. 10p.
Publikováno v:
Asian Journal of Control; May2020, Vol. 22 Issue 3, p1177-1187, 11p
A Method of Relative Calibration Developed for very High Consistency of Internal Metrology Standards
Autor:
Siyuan F. Yang
Publikováno v:
ECS Transactions. 44:1117-1122
A method of relative calibration is developed in this work to calibrate the golden Standard wafers (VLSI Standard or self-prepared Standard wafers) from each geographical site to achieve very high consistency across all sites with relevant factors un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f05bd64de46f92e77d02688427d6f277
https://doi.org/10.1149/1.3694437
https://doi.org/10.1149/1.3694437
Publikováno v:
TIME Magazine. 7/8/2013, Vol. 182 Issue 2, p94. 2p.
Autor:
Levinson, Harry J.
Publikováno v:
Solid State Technology. Nov97, Vol. 40 Issue 11, p141. 5p. 3 Diagrams, 2 Charts, 4 Graphs.
Autor:
Lojo, María Rosa
Publikováno v:
Antigonish Review. Spring2006, Vol. 37 Issue 145, p120-123. 4p.