Zobrazeno 1 - 10
of 45
pro vyhledávání: '"Glorieux, Maximilien"'
Typical design flows are hierarchical and rely on assembling many individual technology elements from standard cells to complete boards. Providers use compact models to provide simplified views of their products to their users. Designers group simple
Externí odkaz:
http://arxiv.org/abs/2104.10941
Autor:
Balakrishnan, Aneesh, Lange, Thomas, Glorieux, Maximilien, Alexandrescu, Dan, Jenihhin, Maksim
Rapidly shrinking technology node and voltage scaling increase the susceptibility of Soft Errors in digital circuits. Soft Errors are radiation-induced effects while the radiation particles such as Alpha, Neutrons or Heavy Ions, interact with sensiti
Externí odkaz:
http://arxiv.org/abs/2104.01908
Autor:
Balakrishnan, Aneesh, Lange, Thomas, Glorieux, Maximilien, Alexandrescu, Dan, Jenihhin, Maksim
As an alternative to traditional fault injection-based methodologies and to explore the applicability of modern machine learning algorithms in the field of reliability engineering, this paper proposes a systemic framework that explores gate-level net
Externí odkaz:
http://arxiv.org/abs/2104.01900
Autor:
Balakrishnan, Aneesh, Lange, Thomas, Glorieux, Maximilien, Alexandrescu, Dan, Jenihhin, Maksim
The paper is proposing a methodology for modeling a gate-level netlist using a Graph Convolutional Network (GCN). The model predicts the overall functional de-rating factors of sequential elements of a given circuit. In the preliminary phase of the w
Externí odkaz:
http://arxiv.org/abs/2104.01812
Selective mitigation or selective hardening is an effective technique to obtain a good trade-off between the improvements in the overall reliability of a circuit and the hardware overhead induced by the hardening techniques. Selective mitigation reli
Externí odkaz:
http://arxiv.org/abs/2008.13664
De-Rating or Vulnerability Factors are a major feature of failure analysis efforts mandated by today's Functional Safety requirements. Determining the Functional De-Rating of sequential logic cells typically requires computationally intensive fault-i
Externí odkaz:
http://arxiv.org/abs/2002.09945
The Functional Failure Rate analysis of today's complex circuits is a difficult task and requires a significant investment in terms of human efforts, processing resources and tool licenses. Thereby, de-rating or vulnerability factors are a major inst
Externí odkaz:
http://arxiv.org/abs/2002.08882
With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can cause circuit-wide effects and thus, significantly contribute to the f
Externí odkaz:
http://arxiv.org/abs/2002.05455
Akademický článek
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Autor:
Glorieux, Maximilien
La miniaturisation des circuits intégrés numériques tend à augmenter leur sensibilité aux radiations. Ainsi le rayonnement naturel peut induire des événements singuliers et porter atteinte à la fiabilité des circuits.Cette thèse porte sur l
Externí odkaz:
http://www.theses.fr/2014AIXM4725