The extension of ID11 for nanoscale and hierarchical characterization

Autor: Vaughan, G. B. M., Wright, J. P., Bytchkov, A., Curfs, C., Gundlach, C., Orlova, M., Erra, L., Gleyzolle, H., Buslaps, T., Götz, A., Suchet, G., Petitdemange, S., Rossat, M., Margulies, L., Ludwig, W., Snigirev, A., Snigireva, I., Søren Schmidt, Henning Osholm Sørensen, Erik Mejdal Lauridsen, Ulrik Lund Olsen, Jette Oddershede, Henning Friis Poulsen

Publikováno v: Technical University of Denmark Orbit
CHALLENGES IN MATERIALS SCIENCE AND POSSIBILITIES IN 3D AND 4D CHARACTERIZATION TECHNIQUES
CHALLENGES IN MATERIALS SCIENCE AND POSSIBILITIES IN 3D AND 4D CHARACTERIZATION TECHNIQUES, 2010, POSTBOX 49, DK-4000 ROSKILDE, Denmark. pp.457-476
ResearcherID

31st Riso International Symposium on Materials Science, Roskilde, DENMARK, SEP 06-10, 2010; International audience; Beamline ID11 at the ESRF has been recently upgraded by the complete redesign of the optics and by the extension of the beamline to 10

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::023b9b14cdd18a98a1626765fa24558a
http://orbit.dtu.dk/en/publications/the-extension-of-id11-for-nanoscale-and-hierarchical-characterization(b5dfd7db-33c7-484c-b93f-c9dfa6357c37).html

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