Zobrazeno 1 - 10
of 105
pro vyhledávání: '"Giovanna Mura"'
Autor:
Giorgio Montisci, Giovanna Mura, Giacomo Muntoni, Giovanni Andrea Casula, Francesco Paolo Chietera, Mahmoud Aburish-Hmidat
Publikováno v:
IEEE Access, Vol 11, Pp 839-848 (2023)
Transparent microstrip patch antennas suffer from low radiation efficiency and gain when manufactured using transparent conductive films (TCFs), mainly at low frequency (starting from the microwave S band). To address this problem, we propose a curve
Externí odkaz:
https://doaj.org/article/fad1c47eba6940cfaab03e22aa3eca19
Autor:
Giovanna Mura, Giovanni Martines
Publikováno v:
2022 4th International Conference on System Reliability and Safety Engineering (SRSE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4741f62258b68b7a2028ac1f9b8b5b1
https://doi.org/10.1109/srse56746.2022.10067413
https://doi.org/10.1109/srse56746.2022.10067413
The starting point is the acquisition of DC data, as usual for drawing the socalled LIV plot, as shown, where current I, optical power P out and the externally applied voltage Vext are drawn together.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef5f0e87696ec11a3f46f73dcbd90eb2
https://doi.org/10.1016/b978-1-78548-154-3.50005-7
https://doi.org/10.1016/b978-1-78548-154-3.50005-7
Autor:
Laurent Béchou, Daniel T. Cassidy, Yves Danto, Yannick Deshayes, Mitsuo Fukuda, Samuel K.K. Lam, Giulia Marcello, Laurent Mendizabal, Giovanna Mura, Yves Ousten, Valerio Sanna Valle, Massimo Vanzi, Frédéric Verdier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac20bdaac777bf9e7978008e289f0968
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
https://doi.org/10.1016/b978-1-78548-154-3.50011-2
Autor:
Mitsuo Fukuda, Giovanna Mura
Laser diodes are the main optical source in various optical fiber communication systems and indispensable for our daily lives. The wavelength of the laser diodes are set at 1300 nm or 1550 nm for most communication systems, including submarine system
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::962cd34e0b8284102c85bb67df39d149
https://doi.org/10.1016/b978-1-78548-154-3.50001-x
https://doi.org/10.1016/b978-1-78548-154-3.50001-x
Autor:
Giovanna Mura
Publikováno v:
Microelectronics Reliability. :26-30
With the term “counterfeit electronic components”, we refer to electronic devices that are misrepresented as to their origin or quality. The greatest risks of using counterfeit parts are personal injury, mission failure and dramatic reduction of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::17cb86b359ce751a724e9740995f5673
https://doi.org/10.1016/j.microrel.2018.06.098
https://doi.org/10.1016/j.microrel.2018.06.098
Publikováno v:
Microelectronics Reliability. :859-863
A modified Hakki-Paoli method, for measuring optical gain in laser diodes, proposed at the past ESREF 2017 conference is here further improved in terms of practical implementation. In particular, averaging both the spectral function and its reciproca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5de728fef93ed2870a51c40f53e03b70
https://doi.org/10.1016/j.microrel.2018.07.086
https://doi.org/10.1016/j.microrel.2018.07.086
Autor:
Guillaume Bascoul, Benoît Viallet, Guy Perez, Giovanna Mura, Helene Chauvin, Gian Paolo Apeddu, Valerio Sanna Valle
Publikováno v:
International Symposium for Testing and Failure Analysis.
Electron Beam Induced Current is a powerful tool for Scanning Electron Microscopy (SEM) imaging mode. In this paper, the history and evolution of this technique are discussed. Some important defects are presented as well as their technological interp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a900fc188495ec6460d3c7e5f844d34
https://doi.org/10.31399/asm.cp.istfa2019p0302
https://doi.org/10.31399/asm.cp.istfa2019p0302
Publikováno v:
Journal of Electronic Materials. 47:4959-4963
Gallium-nitride-based diode lasers were intentionally damaged using single sub-μs current pulses. This approach provoked catastrophic optical damage, a known sudden degradation mechanism, which becomes evident as surface modification at the aperture
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::732e6380caf6350c904474a1f1ab9b07
https://doi.org/10.1007/s11664-018-6144-6
https://doi.org/10.1007/s11664-018-6144-6