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pro vyhledávání: '"Giovanna Franchino"'
Autor:
Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino, Salvatore Rinaudo, Ioannis Deretzis, Antonino La Magna, Matteo Sonza Reorda
Publikováno v:
Electronics; Volume 11; Issue 2; Pages: 203
Electronics, Vol 11, Iss 203, p 203 (2022)
Electronics, Vol 11, Iss 203, p 203 (2022)
This paper compares different types of resistive defects that may occur inside low-power SRAM cells, focusing on their impact on device operation. Notwithstanding the continuous evolution of SRAM device integration, manufacturing processes continue t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::db8b660a7083af33a7d5468fa73b375a
