Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Giorgio Pollaccia"'
Autor:
Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
Publikováno v:
IEEE Transactions on Computers. 72:1447-1459
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::de5511a488ec2bea68f330cbb1ef58fa
https://doi.org/10.1109/tc.2022.3199994
https://doi.org/10.1109/tc.2022.3199994
Autor:
Giorgio Pollaccia, Claudia Bertani, Stefano Littardi, Roberto Ugioli, D. Appello, Walter Ruggeri, Matteo Sonza Reorda, V. Tancorre, Paolo Bernardi
Publikováno v:
DTIS
Burn-In equipment provide both external and internal stress to the device under test. External stress, such as thermal stress, is provided by a climatic chamber or by socket-level local temperature forcing tools, and aims at aging the circuit materia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4889dc4db638329f71fc31530b314195
https://doi.org/10.1109/dtis53253.2021.9505067
https://doi.org/10.1109/dtis53253.2021.9505067
Autor:
Roberto Ugioli, Paolo Bernardi, S. Quer, S. Littardi, Giorgio Pollaccia, D. Appello, V. Tancorre, A. Calabrese
Publikováno v:
DDECS
With the explosion of off-the-shelf SoCs in terms of size and the advent of novel techniques related to failure modes, commercial ATPG and fault simulation engines can often be insufficient to measure the coverage of very specific metrics. In these c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::384500985511f3510f271aa95d5f8409
http://hdl.handle.net/11583/2909176
http://hdl.handle.net/11583/2909176
Autor:
Riccardo Cantoro, Conrad Bugeja, Federico Venini, Giorgio Pollaccia, D. Appello, M. Restifo, Paolo Bernardi
Publikováno v:
Journal of Electronic Testing. 34:43-52
The cost of Burn-In is a major concern for the testing of Automotive Systems-on-Chip (SoC). This paper highlights problematic aspects of a Burn-In flow and describes a two-layered adaptive technique that permits to optimize the stress application and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::32113092e24b4b04ebea90b88fd67b7a
https://doi.org/10.1007/s10836-018-5705-1
https://doi.org/10.1007/s10836-018-5705-1
Autor:
Giorgio Pollaccia, M. Restifo, Paolo Bernardi, D. Appello, V. Tancorre, Giulio Zoppi, F. Almeida, M. Sonza Reorda, D. Calabrese, Roberto Ugioli
Publikováno v:
DDECS
Automotive systems must reach a high reliability in their electronic components. This kind of devices must undergo several tests and stress steps discovering all possible defects that could manifest during lifetime. Burn-In (BI) is a manufacturing te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fbb3fc23199c690eb0ce9d8c90b024fc
https://doi.org/10.1109/ddecs.2019.8724644
https://doi.org/10.1109/ddecs.2019.8724644
Autor:
Paolo Bernardi, D. Appello, Ernesto Sánchez, Conrad Bugeja, Giorgio Pollaccia, Federico Venini, Riccardo Cantoro, Andrea Colazzo, Alberto Pagani, Alessandro Motta, M. Restifo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9afd2939d7097f6e835ccab8ba2cd924
http://hdl.handle.net/11583/2698575
http://hdl.handle.net/11583/2698575
Autor:
Ernesto Sanchez, M. Restifo, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, D. Appello, Federico Venini, Riccardo Cantoro
Early life failures have to be excluded to fulfill the high reliability needs of automotive electronics. While burn-in test may be an effective technique, it is also a very significant cost factor. This article presents strategies for stress test par
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f71f047d9cceb0a5cb969a023743a20
http://hdl.handle.net/11583/2698573
http://hdl.handle.net/11583/2698573
Autor:
Paolo Bernardi, D. Appello, Erwing R. Sanchez, Alessandro Motta, Federico Venini, C.M. Villa, C. Rabbi, M. Restifo, Priit Ruberg, G. Giacopelli, Alberto Pagani, Giorgio Pollaccia
Publikováno v:
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
DATE
DATE
Environmental and electrical stress phases are commonly applied to automotive devices during manufacturing test. The combination of thermal and electrical stress is used to give rise to early life latent failures that can be naturally found in a popu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ac3a0dfc6b0e1207260cec6053b09c7
http://hdl.handle.net/11583/2658889
http://hdl.handle.net/11583/2658889