Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Giorgio Badino"'
Autor:
Martin Knaipp, Giorgio Badino, Enrico Brinciotti, Juergen Smoliner, Georg Gramse, Ferry Kienberger
Publikováno v:
IEEE Transactions on Nanotechnology. 16:245-252
We quantitatively image the doping concentration and the capacitance of a high-voltage lateral metal-oxide-semiconductor transistor device with a channel length of 0.5 μm at 20-GHz frequency using scanning microwave microscopy (SMM). The transistor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80c85bdb3075737eff6d36e630062d9e
https://doi.org/10.1109/tnano.2017.2657888
https://doi.org/10.1109/tnano.2017.2657888
Autor:
Gabriel Gomila, Maria Chiara Biagi, Rene Fabregas, Laura Fumagalli, Georg Gramse, Giorgio Badino
Publikováno v:
Biagi, M C, Badino, G, Fabregas, R, Gramse, G, Fumagalli, L & Gomila, G 2017, ' Direct mapping of the electric permittivity of heterogeneous non-planar thin films at gigahertz frequencies by scanning microwave microscopy ', Physical Chemistry Chemical Physics: high quality research in physical chemistry, chemical physics and biophysical chemistry, vol. 19, pp. 3884-3893 . https://doi.org/10.1039/C6CP08215G
Recercat. Dipósit de la Recerca de Catalunya
instname
Dipòsit Digital de la UB
Universidad de Barcelona
Recercat. Dipósit de la Recerca de Catalunya
instname
Dipòsit Digital de la UB
Universidad de Barcelona
We obtained maps of electric permittivity at ∼19 GHz frequencies on non-planar thin film heterogeneous samples by means of combined atomic force-scanning microwave microscopy (AFM-SMM). We show that the electric permittivity maps can be obtained di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::21078aff2cb2873b9d9e081db09e45c7
https://www.research.manchester.ac.uk/portal/en/publications/direct-mapping-of-the-electric-permittivity-of-heterogeneous-nonplanar-thin-films-at-gigahertz-frequencies-by-scanning-microwave-microscopy(1b4c7d8a-eb76-4b4c-9f07-b44444202cc8).html
https://www.research.manchester.ac.uk/portal/en/publications/direct-mapping-of-the-electric-permittivity-of-heterogeneous-nonplanar-thin-films-at-gigahertz-frequencies-by-scanning-microwave-microscopy(1b4c7d8a-eb76-4b4c-9f07-b44444202cc8).html
Autor:
Silviu-Sorin, Tuca, Giorgio, Badino, Georg, Gramse, Enrico, Brinciotti, Manuel, Kasper, Yoo Jin, Oh, Rong, Zhu, Christian, Rankl, Peter, Hinterdorfer, Ferry, Kienberger
Publikováno v:
Nanotechnology. 27(13)
The application of scanning microwave microscopy (SMM) to extract calibrated electrical properties of cells and bacteria in air is presented. From the S 11 images, after calibration, complex impedance and admittance images of Chinese hamster ovary ce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::1eb4bfe7b7a00660ec70d7a1455b01e8
https://pubmed.ncbi.nlm.nih.gov/26895571
https://pubmed.ncbi.nlm.nih.gov/26895571
Autor:
A. Altes, Thomas Schweinboeck, Matthias A. Fenner, S. Hommel, Ferry Kienberger, Giorgio Badino, Silviu-Sorin Tuca, Enrico Brinciotti, Georg Gramse, Manuel Kasper, Juergen Smoliner
Publikováno v:
Nanoscale. 7(35)
We present a new method to extract resistivity and doping concentration of semiconductor materials from Scanning Microwave Microscopy (SMM) S11 reflection measurements. Using a three error parameters de-embedding workflow, the S11 raw data are conver
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dd079c17157dd1b8f147ef6741def09e
https://pubmed.ncbi.nlm.nih.gov/26282633
https://pubmed.ncbi.nlm.nih.gov/26282633
Autor:
Romolo Marcelli, Ferry Kienberger, Giorgio Badino, L. Michalas, Andrea Lucibello, Enrico Brinciotti, C. H. Joseph, Emanuela Proietti
A methodology towards de-embedding contact mode scanning microwave microscopy (SMM) reflection measurements is presented. A calibration standard that consists of differently doped stripes is required, while the reflection coefficient amplitude |S11|,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0ecc3c25dbfdde115c5d5b3b46a7ee31
Autor:
Georg Gramse, Giorgio Badino, S. Hommel, Juergen Smoliner, Thomas Schweinboeck, Manuel Kasper, Giulio Campagnaro, Ferry Kienberger, Enrico Brinciotti, Silviu Sorin Tuca
Publikováno v:
IEEE Transactions on Nanotechnology. :1-1
Broadband $\text{dS}_{11}/\text{dV}$ dopant profiling at gigahertz frequencies and in situ calibrated capacitance–voltage spectroscopy of silicon p–n junctions using scanning microwave microscopy (SMM) are reported. Using a 3-D finite element mod
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::976013e3c9f1c13b5396fbc7428b6b68
https://doi.org/10.1109/tnano.2016.2628206
https://doi.org/10.1109/tnano.2016.2628206