Zobrazeno 1 - 10
of 261
pro vyhledávání: '"Giorgio Baccarani"'
Autor:
Elena Gnani, Giorgio Baccarani
Publikováno v:
Reference Module in Materials Science and Materials Engineering ISBN: 9780128035818
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80363029471feba79ae33e0d5e48bf6c
https://doi.org/10.1016/b978-0-323-90800-9.00173-6
https://doi.org/10.1016/b978-0-323-90800-9.00173-6
Autor:
Elena Gnani, Giorgio Baccarani
Publikováno v:
Reference Module in Materials Science and Materials Engineering ISBN: 9780128035818
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0b90112ff0929182b6b80501056e689a
https://doi.org/10.1016/b978-0-323-90800-9.00236-5
https://doi.org/10.1016/b978-0-323-90800-9.00236-5
Publikováno v:
Springer Handbook of Semiconductor Devices ISBN: 9783030798260
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9cb7c59e7262b8525e932e628751ecc
https://doi.org/10.1007/978-3-030-79827-7_10
https://doi.org/10.1007/978-3-030-79827-7_10
Publikováno v:
Springer Handbook of Semiconductor Devices ISBN: 9783030798260
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba77487de4bc28066e5224ebf4cf7a56
https://doi.org/10.1007/978-3-030-79827-7_41
https://doi.org/10.1007/978-3-030-79827-7_41
Autor:
Jan Vobecky, Antonio Gnudi, Luigi Balestra, Carlo Tosi, Giorgio Baccarani, Elena Gnani, Susanna Reggiani, J. Dobrzynska
Publikováno v:
IEEE Journal of Emerging and Selected Topics in Power Electronics. 9:2155-2162
An electroactive passivation for high-voltage diodes with bevel termination has been investigated based on diamond-like carbon (DLC) films. Variations of the DLC properties, i.e., conductivity and geometry, have been investigated by experiments and n
Autor:
Davide Cornigli, Dhanoop Varghese, Elena Gnani, Antonio Gnudi, Luu Nguyen, Davide Fabiani, Srikanth Krishnan, Susanna Reggiani, Giorgio Baccarani, Enis Tuncer
Publikováno v:
IEEE Transactions on Dielectrics and Electrical Insulation. 25:2421-2428
The properties of different molding-compound materials with high filler contents have been investigated in order to assess their electrical properties. The experimental part of the present work has been focused on dielectric spectroscopy and steady-s
Autor:
Giorgio Baccarani, Srikanth Krishnan, Antonio Gnudi, Susanna Reggiani, Enis Tuncer, Dhanoop Varghese, Elena Gnani, Luu Nguyen, Davide Fabiani, Davide Cornigli
Publikováno v:
Microelectronics Reliability. :752-755
The effects of moisture on the electrical properties of epoxy molding compounds containing high quantities of silica filler microparticles have been investigated by means of dielectric spectroscopy, steady-state conductivity and pulsed electro-acoust
Autor:
Luigi Balestra, J. Vobecký, Antonio Gnudi, C. Tosi, Giorgio Baccarani, Susanna Reggiani, J. Dobrzynska, Elena Gnani
Publikováno v:
Microelectronics Reliability. :1094-1097
The most relevant transport features of doped diamond-like carbon (DLC) films have been implemented in a TCAD setup to provide a theoretical tool to assess the reliability expectations for high-voltage device passivation. Starting from the band struc
Publikováno v:
IEEE Transactions on Electron Devices. 64:3108-3113
A simulation study on the impact of interface traps and strain on the ${I}$ – ${V}$ characteristics of co-optimized p- and n-type tunnel FETs (TFETs) realized on the same InAs/Al0.05Ga0.95Sb technology platform is carried out, using a full-quantum
Autor:
Alejandro Hernandez-Luna, Dhanoop Varghese, Woojin Ahn, Srikanth Krishnan, Giorgio Baccarani, Luu Nguyen, Ilaria Imperiale, Antonio Gnudi, Susanna Reggiani, Muhammad A. Alam, Giuseppe Pavarese, Elena Gnani
Publikováno v:
IEEE Transactions on Electron Devices. 64:1209-1216
High electric fields and temperatures in high-voltage ICs (HV-ICs) can induce charge transport phenomena in the encapsulation material leading to reliability test failures. In this paper, the resistivity of epoxy-based resins with insulating microfil