Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Gilles Raynaud"'
Autor:
Jacques Gierak, Gilles Raynaud, Caroline Guiziou, Jean René Coudevylle, Ali Madouri, Lars Bruchhaus, Achim Nadzeyka, Björn Whittman, Ralf Jede, Christophe David, Jean Christophe Girard
Publikováno v:
Journal of Vacuum Science & Technology B. 40:052602
Graphene, a single layer of carbon atoms tightly bound in a hexagonal honeycomb lattice to form a two-dimensional lattice, is a very interesting material with promising electronic, optical, chemical, and mechanical applicative potential [Geim and Nov
Publikováno v:
Microsystem Technologies. 12:38-43
This paper describes the development for a model of a nuclear magnetic resonance spiral coil sensor using analog hardware description. Our procedure implies several steps with emphasis on model complexity reduction, identification of critical paramet
Autor:
Hervé Mathias, Gilles Raynaud, Pierre Cusin, Nicolas Faure, Gerold Schröpfer, S. Megherbi, Fabien Parrain, J.-P. Gilles, Alain Bosseboeuf
Publikováno v:
Microsystem Technologies. 12:8-14
Recent developments in micro-electro-mechanical systems and micromachining technologies have made possible the development and integration of micromirrors that can be employed for a number of consumer applications such as free space optical switching
Publikováno v:
5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, 2004. EuroSimE 2004. Proceedings of the.
This paper describes the development of a model of a nuclear magnetic resonance (NMR) spiral coil sensor, using an analog hardware description. Our procedure implies several steps, with emphasis on model complexity reduction, identification of critic
Publikováno v:
Proceedings of the 39th Midwest Symposium on Circuits and Systems.
High frequency small-signal measurements provide information for time-domain device characterisation. Parasitic phenomena associated with probe and interconnect-metal lines surrounding the device, have an impact on measurements during wafer test. The
Autor:
Fabien Parrain, Souhil Megherbi, Gilles Raynaud, Herv Mathias, Jean-Paul Gilles, Alain Bosseboeuf, Gerold Schrpfer, Nicolas Faure, Pierre Cusin
Publikováno v:
Microsystem Technologies; Dec2005, Vol. 12 Issue 1/2, p8-14, 7p