Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Gilho Gu"'
Autor:
Jiwon Jeong, Kwang Hun Kim, Gilho Gu, Young-Min Kim, Sang Ho Oh, Aleksander Kostka, Woo-Sung Jang
Publikováno v:
Microscopy and Microanalysis. 27:237-249
Two advanced, automated crystal orientation mapping techniques suited for nanocrystalline materials—precession electron diffraction (PED) in transmission electron microscopy (TEM) and on-axis transmission Kikuchi diffraction (TKD) in scanning elect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e90219223233d96fa7d461c3b2a2189
https://doi.org/10.1017/s1431927621000027
https://doi.org/10.1017/s1431927621000027
Autor:
Yong-Il Kim, Joosung Kim, Young-jo Tak, Jun-Youn Kim, Joong Jung Kim, Hyun Kum, Youngsoo Park, Dong-gun Lee, Mi Hyun Kim, Jongsun Maeng, Gilho Gu
Publikováno v:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 33:060602
The reverse bias leakage characteristics of InGaN/GaN light emitting diodes (LEDs) grown on Si (111) were investigated as a function of two factors: (1) bulk depletion width and (2) V-pit size. The reverse leakage current showed a decreasing trend wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42871b584c31141729d77a5e830aba03
https://doi.org/10.1116/1.4933039
https://doi.org/10.1116/1.4933039
Autor:
Hyun Kum, Mihyun Kim, Dong-gun Lee, Youngjo Tak, Jongsun Maeng, Joosung Kim, Gilho Gu, Joong Jung Kim, Yongil Kim, Jun-Youn Kim, Youngsoo Park
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Nov/Dec2015, Vol. 33 Issue 6, p060602-1-060602-4, 4p
Publikováno v:
2011 IEEE Nanotechnology Materials & Devices Conference; 1/ 1/2011, p147-150, 4p