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pro vyhledávání: '"Gilbert Leibeling"'
Autor:
Gilbert Leibeling, Hana Ouslimani, Pascal Birckigt, Martin Heusinger, Kevin Grabowski, Stefan Risse, Thomas Flügel-Paul
Publikováno v:
Applied Physics A. 127
Defect free direct bonding of rigid and large area glass samples, such as prisms, becomes increasingly important for the manufacturing of modern optical and optomechanical components. Typically, in order to apply a static load during the annealing st
Autor:
Kai Grurmann, Heikki Kettunen, Fritz Gliem, Veronique Ferlet-Cavrois, Hagen Schmidt, Gilbert Leibeling, Martin Herrmann
16/32-Gbit NAND-Flash and 4-Gbit DDR3 SDRAM memories have been tested under heavy ion irradiation. At high LET, 25nm NAND-Flash show MBUs at normal incidence. Techniques for SEFI mitigation in DDR3 SDRAM are studied.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b234a1407ebd42993b6fbd016f1f6c8e
http://juuli.fi/Record/0246569012
http://juuli.fi/Record/0246569012