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Autor:
Chang Hun Lee, Ju Hee Noh, Hyeon Deok Lee, Young Sub You, Seok Jae Kim, Kong Soo Lee, Yong Woo Hyung, Gil Hwan Son, Daehan Yoo, Jae Jong Han, Yong Kwon Kim
Publikováno v:
Japanese Journal of Applied Physics. 45:L1193-L1196
Germanium (Ge) ion implantation was investigated for crystallinity enhancement during solid phase epitaxial (SPE) regrowth. Electron back-scatter diffraction (EBSD) measurement showed numerical increase of 19% of (100) signal, which might be due to t