Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Giewont, Kenneth J."'
Autor:
B.J. Offrein, Kate McLean, Jason S. Orcutt, Marwan H. Khater, B. Porth, Folkert Horst, Chi Xiong, Robert K. Leidy, Edward W. Kiewra, Karen Nummy, D. M. Gill, Jessie Rosenberg, N. B. Feilchenfeld, Wilfried Haensch, Giewont Kenneth J, F. G. Anderson, Andy Stricker, Tymon Barwicz, Yves Martin, W. M. J. Green, Charles A. Whiting
Publikováno v:
ECOC
Monolithic silicon photonic technology provides high bandwidth and large volume for datacom applications, while maintaining the low-cost assembly and waferscale test readiness characteristic of CMOS. Monolithic integration and high-yield CMOS process
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97581761435b7980c8226b5f0ce8b689
https://doi.org/10.1109/ecoc.2017.8346134
https://doi.org/10.1109/ecoc.2017.8346134
Autor:
D. M. Gill, N. B. Feilchenfeld, Edward W. Kiewra, William M. J. Green, Karen Nummy, T. Doan, Zoey Sowinski, Marwan H. Khater, Brett T. Cucci, Jason S. Orcutt, Kate McLean, Chienfan Yu, Andy Stricker, C. Willets, B. Porth, Tymon Barwicz, Charles A. Whiting, S. Yum, Robert K. Leidy, Chi Xiong, D. Dang, Javier Ayala, M. Ghosal, Jessie Rosenberg, Giewont Kenneth J
Publikováno v:
SPIE Proceedings.
Silicon photonics is rapidly becoming the key enabler for meeting the future data speed and volume required by the Internet of Things. A stable manufacturing process is needed to deliver cost and yield expectations to the technology marketplace. We p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58764a47c91986d90cd054f94c169b38
https://doi.org/10.1117/12.2263472
https://doi.org/10.1117/12.2263472
Autor:
Wasik, Chet, Murphy, G. P., Chen, Alek C., Krasnoperova, Azalia A., Flamholz, Alex L., DeMay, Daniel J., Leavey, Jeffrey A., Loh, Steve, Chaloux, Sue, Thomas, Alan C., Lee, Sang, Giewont, Kenneth J., Agnello, Paul D.
Publikováno v:
Proceedings of SPIE; Nov1998, Issue 1, p150-156, 7p
Autor:
Blow, Victor O., Giewont, Kenneth J.
Publikováno v:
Proceedings of SPIE; Nov1991, Issue 1, p107-111, 5p
Publikováno v:
Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 1997, Vol. 15 Issue 4, p916-920, 5p