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pro vyhledávání: '"Gianluca Brozzetti"'
Autor:
Federico Alimenti, Guendalina Simoncini, Gianluca Brozzetti, Daniele Dal Maistro, Marc Tiebout
Publikováno v:
IEEE Access, Vol 8, Pp 178976-178990 (2020)
Integrated noise sources (or hot loads) are essential to enable precise gain and noise figure Built-In Test Equipment (BITE) measurements. The present paper describes a millimeter-wave, solid-state noise source implemented in a standard, 130-nm Silic
Externí odkaz:
https://doaj.org/article/a8a21a927587483e8e3070069b051f7d
