Zobrazeno 1 - 10
of 57
pro vyhledávání: '"Gianfranco Vitali"'
Publikováno v:
Microscopy of Semiconducting Materials, 1983
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8c775b6babad03f3f0ff66626eb7859
https://doi.org/10.1201/9781003069614-32
https://doi.org/10.1201/9781003069614-32
Autor:
Daniela Gogova, Giuseppe Zollo, Christo Angelov, Gianfranco Vitali, Kostadinka Gesheva, Emil Vlakhov, Yordan G. Marinov, Nikolai Pashov, Tatyana Ivanova, M. Kalitzova
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 229:65-72
The effect of high-frequency electromagnetic field (HFEMF) on the electrical properties of metal ion beam implanted silicon was studied. Silicon wafers, (1 0 0) oriented, were implanted with Zn + , Te + or Bi + with energy of 50 keV and fluences from
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4ab914974df8844b1d2604708017b525
https://doi.org/10.1016/j.nimb.2004.10.088
https://doi.org/10.1016/j.nimb.2004.10.088
Publikováno v:
Journal of Materials Science: Materials in Electronics. 14:783-786
Nanosized precipitation in high-dose Zn+- and Bi+-implanted Si is investigated by high-resolution transmission electron microscopy of cross-sectional specimens. In spite of the different diffusivities of Zn and Bi in Si, their low solubility results
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::984f434957df8099da265d98cae88d5c
https://doi.org/10.1023/a:1026296103855
https://doi.org/10.1023/a:1026296103855
Autor:
Marian Tzolov, D. Dimova-Malinovska, Ivan Gueorguiev Ivanov, N Tzenov, Gianfranco Vitali, M. Kalitzova, Giuseppe Zollo, C. Pizzuto
Publikováno v:
Scopus-Elsevier
ZnO:Al films were deposited by RF magnetron sputtering in triode configuration applying an external DC electric field to the substrates. Reflection high-energy electron diffraction measurements characterized the different films as consisting of rando
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::631d0fed9ca3dbbd81d7a17ff6d89528
https://doi.org/10.1016/s0040-6090(01)01182-8
https://doi.org/10.1016/s0040-6090(01)01182-8
Autor:
M. Kalitzova, Ivan Gueorguiev Ivanov, Gianfranco Vitali, Giuseppe Zollo, C. Pizzuto, D. Dimova-Malinovska, N Tzenov, Marian Tzolov
Publikováno v:
Thin Solid Films. 379:28-36
Highly conductive and transparent in the visible range Al-doped ZnO (ZnO:Al) and undoped ZnO films have been deposited by RF magnetron sputtering. Reflection high-energy electron diffraction observations characterized them as textured. The habitus of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::553f70ee12fa18443d494a1c2b6677ea
https://doi.org/10.1016/s0040-6090(00)01413-9
https://doi.org/10.1016/s0040-6090(00)01413-9
Publikováno v:
Vacuum. 58:516-522
The effects of N 2 annealing atmosphere on implanted and low-power pulsed-laser annealed (LPPLA) InP matrix are discussed. The analyses were performed, by using several complementary techniques such as RBS, Raman spectroscopy, SIMS and electrical mea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6fa3c2e2e07aaa409d1945b37a3b36c9
https://doi.org/10.1016/s0042-207x(00)00214-1
https://doi.org/10.1016/s0042-207x(00)00214-1
Publikováno v:
Scopus-Elsevier
Low-power pulsed-laser annealing was applied to Zn+-implanted InP samples. In order to avoid surface oxidation during the treatment, the laser irradiation was carried out in inert ambient of nitrogen at different pressures. The analytical techniques
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::baef9d5292d568d0072aafb0a4555893
https://doi.org/10.1063/1.366300
https://doi.org/10.1063/1.366300
Autor:
Anelia Kakanakova-Georgieva, Ts. Marinova, M. Kalitzova, C. Pizzuto, Gianfranco Vitali, Giuseppe Zollo
Publikováno v:
Scopus-Elsevier
Data on the effects of 140 keV Zn+-implantation in (100) GaAs and the consequent low power pulsed laser annealing (LPPLA) on the As/Ga ratio and the chemical states of the elements at the surface and in the subsurface region are presented. The result
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::192258c437b07d30794288055a774c61
https://doi.org/10.1016/s0169-4332(96)00744-1
https://doi.org/10.1016/s0169-4332(96)00744-1
Publikováno v:
Scopus-Elsevier
Reflection high‐energy electron diffraction (RHEED) technique, with the possibility to shift, rotate, and tilt the sample with respect to the electron beam, has been used to investigate the structure of the transition layers formed at the interface
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f080f3f4e2b7eea6a636abe1a16c0c03
https://doi.org/10.1063/1.363228
https://doi.org/10.1063/1.363228
Publikováno v:
Scopus-Elsevier
Structurally different carbon films selectively generated at the surface of glassy carbon, titanium, and silica glass substrates are tested as nucleating layers for diamond synthesis by hot filament chemical vapour deposition (HFCVD). Before the CVD
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d82fd6564ba78e328ebf778ccb6dd14
https://doi.org/10.1002/pssa.2211540111
https://doi.org/10.1002/pssa.2211540111