Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Giancarlo Castaneda"'
Publikováno v:
Journal of Critical Care. 40:269
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::832b532e26c58f765d2ec3eff4bd6482
https://doi.org/10.1016/j.jcrc.2017.02.003
https://doi.org/10.1016/j.jcrc.2017.02.003
Publikováno v:
Journal of Low Power Electronics
Journal of Low Power Electronics, American Scientific Publishers, 2014, 10 (1), pp.127-136. ⟨10.1166/jolpe.2014.1304⟩
Journal of Low Power Electronics, American Scientific Publishers, 2014, 10 (1), pp.127-136. ⟨10.1166/jolpe.2014.1304⟩
International audience; In modern CMOS technologies, Local Layout Effects (LLE) induced by increased integration density translate into significant systematic variations of Logic delays. Accurate and test-efficient LLE characterization methodology of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::764b0fb10fd18f37e8630a50fc981305
https://hal.archives-ouvertes.fr/hal-02050867
https://hal.archives-ouvertes.fr/hal-02050867
Publikováno v:
2012 IEEE International Conference on Microelectronic Test Structures.
An improved methodology for MOSFETs access resistance extraction using Kelvin test structures is presented. By a drastic reduction of the influence of the device stochastic variations, along with an improved methodology for sub 50nm technologies, one
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::648d77c46a0527711f9cc7f32b974ac4
https://doi.org/10.1109/icmts.2012.6190634
https://doi.org/10.1109/icmts.2012.6190634
Autor:
Dominique Golanski, David Hoguet, Bertrand Borot, Jean-Michel Portal, Giancarlo Castaneda, Gerard Ghibaudo, Andre Juge
Publikováno v:
2012 IEEE International Conference on Microelectronic Test Structures.
We study the limitations of single transistor test structures for Process Variations monitoring in presence of statistical random variability, and compare them with transistor array structures in 45 CMOS technology. By optimizing transistor array des
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76a1e399ae52583780113da6117aeb95
https://doi.org/10.1109/icmts.2012.6190609
https://doi.org/10.1109/icmts.2012.6190609