Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Gi-Doo Lee"'
Publikováno v:
IEEE Transactions on Electron Devices. 59:3313-3320
This work investigates the robustness of a stacked or cascoded driver under electrostatic discharge (ESD) events. Using output driver circuits in an actual I/O system with predrivers and rail-based power clamps, the impacts of all possible predriver
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eabcc4a3e5c69ad1351bc236d5f5c351
https://doi.org/10.1109/ted.2012.2222888
https://doi.org/10.1109/ted.2012.2222888
Autor:
Donghyuk Park, Chung Youngwoo, Tae Chan Kim, Gab-Soo Han, Young-Chan Kim, Yunkyung Kim, Duck-Hyung Lee, Jeonsook Lee, Eun-Kyung Park, Seungjoo Nah, Y. Jay Jung, Dongyoung Jang, Gyehun Choi, Hong-ki Kim, Jong-Eun Park, Yi-tae Kim, Taeheon Lee, Jung-Chak Ahn, Yooseung Lee, Yujung Choi, Kyung-Ho Lee, Joon-Hyuk Im, Bum-Suk Kim, Mi Hye Kim, Daniel K. J. Lee, Haeyong Park, Heesang Kown, Sangjun Choi, Ihara Hisanori, Goto Hiroshige, Byung-hyun Yim, Won-Je Park, Sung-Ho Choi, Youngsun Oh, Seung-Wook Lee, Taesub Jung, H.S. Jeong, Chi-Young Choi, Gi-Doo Lee
Publikováno v:
ISSCC
According to the trend towards high-resolution CMOS image sensors, pixel sizes are continuously shrinking, towards and below 1.0μm, and sizes are now reaching a technological limit to meet required SNR performance [1-2]. SNR at low-light conditions,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1cc98089be8daa57e0c0f8ae1d5d95de
https://doi.org/10.1109/isscc.2014.6757365
https://doi.org/10.1109/isscc.2014.6757365