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Autor:
Boneschanscher, M. P., Evers, W. H., Geuchies, J. J., Altantzis, T., Goris, B., Rabouw, F. T., van Rossum, S. A. P., van der Zant, H. S. J., Siebbeles, L. D. A., Van Tendeloo, G., Swart, I., Hilhorst, J., Petukhov, Andrei V., Bals, S., Vanmaekelbergh, D., Condensed Matter and Interfaces, Physical and Colloid Chemistry, Sub Condensed Matter and Interfaces, Sub Physical and Colloid Chemistry
Publikováno v:
Science
Science, 344(6190), 1377. American Association for the Advancement of Science
Science, 344(6190), 1377. American Association for the Advancement of Science
Nanoparticle lattices and surfaces The challenge of resolving the details of the surfaces or assemblies of colloidal semiconductor nanoparticles can be overcome if several characterization methods are used (see the Perspective by Boles and Talapin).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c9ec95311b59ae4a90a6dd6def1a1f89
https://dspace.library.uu.nl/handle/1874/308001
https://dspace.library.uu.nl/handle/1874/308001
Preparation and study of 2-D semiconductors with Dirac type bands due to the honeycomb nanogeometry.
Autor:
Kalesaki, E., Boneschanscher, M. P., Geuchies, J. J., Delerue, C., Morais Smith, C., Evers, W. H., Allan, G., Altantzis, T., Bals, S., Vanmaekelbergh, D.
Publikováno v:
Proceedings of SPIE; Nov2014, p1-9, 9p
Autor:
Freundlich, Alexandre, Guillemoles, Jean-François, Kalesaki, E., Boneschanscher, M. P., Geuchies, J. J., Delerue, C., Morais Smith, C., Evers, W. H., Allan, G., Altantzis, T., Bals, S., Vanmaekelbergh, D.
Publikováno v:
Proceedings of SPIE; March 2014, Vol. 8981 Issue: 1 p898107-898107-9
Autor:
Boneschanscher MP; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands., Evers WH; Opto-electronic Materials Section, Delft University of Technology, Julianalaan 136, 2628 BL Delft, Netherlands. Kavli Institute of Nanoscience, Delft University of Technology, Post Office Box 5046, 2600 GA Delft, Netherlands., Geuchies JJ; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands., Altantzis T; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium., Goris B; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium., Rabouw FT; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands., van Rossum SA; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands., van der Zant HS; Kavli Institute of Nanoscience, Delft University of Technology, Post Office Box 5046, 2600 GA Delft, Netherlands., Siebbeles LD; Opto-electronic Materials Section, Delft University of Technology, Julianalaan 136, 2628 BL Delft, Netherlands., Van Tendeloo G; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium., Swart I; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands., Hilhorst J; European Synchrotron Radiation Facility (ESRF), Grenoble, Beamline ID01, France., Petukhov AV; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands., Bals S; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium., Vanmaekelbergh D; Debye Institute for Nanomaterials Science, University of Utrecht, Post Office Box 80.000, 3508 TA Utrecht, Netherlands. d.vanmaekelbergh@uu.nl.
Publikováno v:
Science (New York, N.Y.) [Science] 2014 Jun 20; Vol. 344 (6190), pp. 1377-80. Date of Electronic Publication: 2014 May 29.