Zobrazeno 1 - 10
of 31
pro vyhledávání: '"Gertrude F. Rempfer"'
Autor:
Luis Almaraz, Rolf Könenkamp, Robert Campbell Word, Todd Dixon, Gertrude F. Rempfer, T. Jones
Publikováno v:
Ultramicroscopy. 110:899-902
We report a spatial resolution of 5.4 nm in images of sarcoplasmic reticulum from rabbit muscle. The images were obtained in an aberration-corrected photoemission electron microscope with a hyperbolic mirror as the correcting element for spherical an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::477c764d2e3b28f9c3aa79461180cff0
https://doi.org/10.1016/j.ultramic.2010.04.005
https://doi.org/10.1016/j.ultramic.2010.04.005
Autor:
J. A. Panitz, Gertrude F. Rempfer
Publikováno v:
American Journal of Physics. 74:953-956
A simple transmission electron microscope (TEM) suitable for lecture demonstrations is described. In this TEM electrons are created in a glow discharge between two parallel electrodes in air at a reduced pressure. The electrons are collimated by a sm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e81f6355a5c327bb2ace3e01b468ca5c
https://doi.org/10.1119/1.2345656
https://doi.org/10.1119/1.2345656
Autor:
Erik Bodegom, Gertrude F. Rempfer
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 519:7-11
We propose the construction of a telescope, which uses charged particles (CPs) instead of light in order to study the dynamics of the astronomical objects. We have indicated the obvious incentives for such a project. Using CPs instead of electromagne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c83027c95ca8604c890620e3cf104fa8
https://doi.org/10.1016/j.nima.2003.11.114
https://doi.org/10.1016/j.nima.2003.11.114
Autor:
Giorgio Margaritondo, Benjamin Gilbert, G. De Stasio, S. Douglas, Kenneth H. Nealson, Gertrude F. Rempfer, Ray F. Egerton
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. :1005-1011
Specimen charging under X-ray illumination is a well known phenomenon that can seriously obstruct the analysis of insulating samples. Synchrotron X-PEEM spectromicroscopy can reach a lateral resolution of 20 nm, 1-2 orders of magnitude larger than el
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be1195f81d4ad0d55cb08ca7edf828e3
https://doi.org/10.1016/s0368-2048(00)00342-x
https://doi.org/10.1016/s0368-2048(00)00342-x
Publikováno v:
Microscopy and Microanalysis. 4:34-49
The performance characteristics of electron microscopes and probe-forming instruments depend ultimately on the focal properties and aberrations of electron lenses. A practical method of experimentally determining the properties of electron lenses is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1de82e6fe737621fb09a74456fd5735f
https://doi.org/10.1017/s1431927698980035
https://doi.org/10.1017/s1431927698980035
Publikováno v:
Microscopy and Microanalysis. 3:14-27
All lenses, whether for light or for electrons, have aberrations that limit their performance. In light optics the invention of the achromat over 200 years ago solved the problem of correcting spherical and chromatic aberrations; however, correcting
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5c6205495aaaf1f322f35a09c6c9f731
https://doi.org/10.1017/s143192769797001x
https://doi.org/10.1017/s143192769797001x
Publikováno v:
Review of Scientific Instruments. 65:3183-3193
A review of electron optical bench literature is presented, and the designs of two optical benches used by the authors are described. One bench was designed for testing individual electrostatic electron lenses and in‐line optical systems, for examp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa91c56af2b87d20ea9ebf74117a87b1
https://doi.org/10.1063/1.1144548
https://doi.org/10.1063/1.1144548
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 347:441-445
A new design of electrostatic optics has been evaluated to improve the performance of the X-ray photoemission microscope (XPEEM) used for micro X-ray-absorption fine-structure imaging. The new optics includes an objective lens with a steep conical sh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8610ed5a9bc0eb0bbbe17a692b0fe1e9
https://doi.org/10.1016/0168-9002(94)91924-0
https://doi.org/10.1016/0168-9002(94)91924-0
Publikováno v:
The Journal of Physical Chemistry. 97:3022-3027
Photoelectron imaging is a surface technique in which low-energy electrons are ejected from the specimen, usually by UV light. In biological applications, the choice of substrates is an important factor. Substrates must be conductive, have low photoe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a722fd61a5609803f38d7590ca7ae27f
https://doi.org/10.1021/j100114a032
https://doi.org/10.1021/j100114a032
Publikováno v:
Journal of Microscopy. 168:249-258
SUMMARY Low-energy electron microscopy (LEEM) and mirror electron microscopy (MEM) utilize a parallel beam of slow-moving electrons backscattered from the specimen surface to form an image. If the electrons strike the surface an LEEM image is produce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b57de54b7aafd088663b559cfa6fcc38
https://doi.org/10.1111/j.1365-2818.1992.tb03267.x
https://doi.org/10.1111/j.1365-2818.1992.tb03267.x