Zobrazeno 1 - 10
of 965
pro vyhledávání: '"Gerth S"'
Publikováno v:
In Materials & Design October 2021 208
Autor:
Popov, I.D., Sochor, B., Schummer, B., Kuznetsova, Yu.V., Rempel, S.V., Gerth, S., Rempel, A.A.
Publikováno v:
In Journal of Non-Crystalline Solids 1 February 2020 529
Autor:
Abdelhafiz I; Fraunhofer Institute for Molecular Biology and Applied Ecology, Ohlebergsweg 12, D-35394, Giessen, Germany., Gerth S; Fraunhofer Institute for Integrated Circuits, Flugplatzstrasse 75, D-90768, Fuerth, Germany., Claussen J; Fraunhofer Institute for Integrated Circuits, Flugplatzstrasse 75, D-90768, Fuerth, Germany., Weule M; Fraunhofer Institute for Integrated Circuits, Flugplatzstrasse 75, D-90768, Fuerth, Germany., Hufnagel E; Fraunhofer Institute for Integrated Circuits, Flugplatzstrasse 75, D-90768, Fuerth, Germany., Vilcinskas A; Fraunhofer Institute for Molecular Biology and Applied Ecology, Ohlebergsweg 12, D-35394, Giessen, Germany.; Institute for Insect Biotechnology, Justus Liebig University of Giessen, Heinrich-Buff-Ring 26, D-35392, Giessen, Germany., Lee KZ; Fraunhofer Institute for Molecular Biology and Applied Ecology, Ohlebergsweg 12, D-35394, Giessen, Germany.
Publikováno v:
Advanced biology [Adv Biol (Weinh)] 2024 Jul; Vol. 8 (7), pp. e2400100. Date of Electronic Publication: 2024 May 26.
Autor:
Gruber R; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany. roland.gruber@iis.fraunhofer.de.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair for Visual Computing, Erlangen, Germany. roland.gruber@iis.fraunhofer.de., Reims N; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany., Hempfer A; Deutsches Museum, München, Germany., Gerth S; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany., Böhnel M; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany., Fuchs T; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany., Salamon M; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany., Wittenberg T; Fraunhofer IIS, Fraunhofer Institute for Integrated Circuits IIS, Division Development Center X-Ray Technology, Fürth, Germany.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair for Visual Computing, Erlangen, Germany.
Publikováno v:
Scientific data [Sci Data] 2024 Jun 24; Vol. 11 (1), pp. 680. Date of Electronic Publication: 2024 Jun 24.
Publikováno v:
In Journal of Crystal Growth 1 August 2016 447:13-17
Autor:
Claussen J; Fraunhofer Institute for Integrated Circuits (IIS), Department Development Center X-ray Technology, Fuerth, Germany., Wittenberg T; Fraunhofer Institute for Integrated Circuits (IIS), Department Development Center X-ray Technology, Fuerth, Germany.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Department for Visual Computing, Erlangen, Germany., Uhlmann N; Fraunhofer Institute for Integrated Circuits (IIS), Department Development Center X-ray Technology, Fuerth, Germany., Gerth S; Fraunhofer Institute for Integrated Circuits (IIS), Department Development Center X-ray Technology, Fuerth, Germany.
Publikováno v:
Frontiers in plant science [Front Plant Sci] 2024 Jan 04; Vol. 14, pp. 1269005. Date of Electronic Publication: 2024 Jan 04 (Print Publication: 2023).
Publikováno v:
In Acta Materialia December 2014 81:401-408
Autor:
Gerth S; Department of Research and Development in Teacher Education, University College of Teacher Education Tyrol, 6010 Innsbruck, Austria., Festman J; Department of Research and Development in Teacher Education, University College of Teacher Education Tyrol, 6010 Innsbruck, Austria.
Publikováno v:
Children (Basel, Switzerland) [Children (Basel)] 2023 Apr 20; Vol. 10 (4). Date of Electronic Publication: 2023 Apr 20.
Autor:
Alle J; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Development Center X-Ray Technology, Fürth, Germany., Gruber R; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Development Center X-Ray Technology, Fürth, Germany.; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair for Visual Computing, Erlangen, Germany., Wörlein N; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Development Center X-Ray Technology, Fürth, Germany., Uhlmann N; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Development Center X-Ray Technology, Fürth, Germany., Claußen J; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Development Center X-Ray Technology, Fürth, Germany., Wittenberg T; Friedrich-Alexander-Universität Erlangen-Nürnberg, Chair for Visual Computing, Erlangen, Germany.; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Smart Sensors and Electronics, Erlangen, Germany., Gerth S; Fraunhofer Institut für Integrierte Schaltungen (IIS), Fraunhofer Institute for Integrated Circuits Institut für Integrierte Schaltungen (IIS), Division Development Center X-Ray Technology, Fürth, Germany.
Publikováno v:
Frontiers in plant science [Front Plant Sci] 2023 Apr 04; Vol. 14, pp. 1120189. Date of Electronic Publication: 2023 Apr 04 (Print Publication: 2023).
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