Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Gerhard Ulbricht"'
Publikováno v:
Applied Sciences, Vol 11, Iss 6, p 2671 (2021)
In recent years Microwave Kinetic Inductance Detectors (MKIDs) have emerged as one of the most promising novel low temperature detector technologies. Their unrivaled scalability makes them very attractive for many modern applications and scientific i
Externí odkaz:
https://doaj.org/article/3ff84752cde74279825db97cbd0c682f
Autor:
Oisin Creaner, Colm Bracken, Jack Piercy, Gerhard Ulbricht, Eoin Baldwin, Mario De Lucia, Tom Ray
Publikováno v:
X-Ray, Optical, and Infrared Detectors for Astronomy X.
Microwave Kinetic Inductance Detectors (MKIDs) are cryogenic photon detectors and are attractive because they permit simultaneous time, energy and spatial resolution of faint astronomical sources. We present a cost-effective alternative to dedicated
Autor:
Vinooja Thurairethinam, Giorgio Savini, Mario De Lucia, Gerhard Ulbricht, Gary Hawkins, Eoin Baldwin, Deirdre Coffey, Jack Piercy, Tom Ray
Publikováno v:
Space Telescopes and Instrumentation 2022: Optical, Infrared, and Millimeter Wave.
Microwave Kinetic Inductance Detector (MKID) arrays are currently being developed and deployed for astronomical applications in the visible and near infrared and for sub-millimetre astronomy. One of the main drawbacks of MKIDs is that large arrays wo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f2c6d6b755adc668198b475168c8cdd7
http://arxiv.org/abs/2204.05715
http://arxiv.org/abs/2204.05715
Autor:
A. Gerlach, Frank Schreiber, Stefan Kowarik, S. Sellner, Helmut Dosch, Stephan Meyer, Jens Pflaum, Gerhard Ulbricht
Publikováno v:
Thin Solid Films. 516:6377-6381
We present a comparative study of the growth of the technologically highly relevant gate dielectric and encapsulation material aluminum oxide in inorganic and also organic heterostructures. Atomic force microscopy studies indicate strong similarities
Autor:
A. Gerlach, N. Kasper, Frank Schreiber, Bruno Gompf, Matthias Fischer, Jens Pflaum, S. Sellner, Marion Kelsch, Helmut Dosch, Gerhard Ulbricht, Stephan Meyer
Publikováno v:
Journal of Materials Research. 21:455-464
We present a detailed study of the thermal stability of organic thin films of diindenoperylene encapsulated by sputtered aluminum oxide layers. We studied the influence of capping layer thickness, stoichiometry, and heating rate on the thermal stabil
Autor:
Gerhard Ulbricht, Stephan Meyer, S. Sellner, Helmut Dosch, Frank Schreiber, Matthias Fischer, Jens Pflaum, Bruno Gompf
Publikováno v:
MRS Proceedings. 965
We performed temperature-dependent studies on pentacene thin film transistors (TFTs) with and without encapsulation. The capping layer is realized either by a sputtering layer of aluminum oxide (AlOx.) or, alternatively, by a polymeric layer of poly-
Autor:
Gerhard Ulbricht
Publikováno v:
Netzwerkanalyse, Netzwerksynthese und Leitungstheorie ISBN: 9783519001102
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8920a6deb293a7968eef0696afd4680
https://doi.org/10.1007/978-3-322-82960-3_3
https://doi.org/10.1007/978-3-322-82960-3_3
Autor:
Gerhard Ulbricht
Publikováno v:
Netzwerkanalyse, Netzwerksynthese und Leitungstheorie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a100c1cc39aa1205631084d0d037ca97
https://doi.org/10.1007/978-3-322-82960-3
https://doi.org/10.1007/978-3-322-82960-3
Autor:
Gerhard Ulbricht
Publikováno v:
Netzwerkanalyse, Netzwerksynthese und Leitungstheorie ISBN: 9783519001102
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f6a7c0c97979a34c314b82c5f000efa
https://doi.org/10.1007/978-3-322-82960-3_2
https://doi.org/10.1007/978-3-322-82960-3_2