Zobrazeno 1 - 10
of 63
pro vyhledávání: '"Gerhard Materlik"'
Publikováno v:
Surface Science. :94-99
We present a detailed study of the interaction of chlorine with the Si(1 1 3) surface by means of scanning tunneling microscopy. Upon chlorine adsorption at a substrate temperature of 600 °C, the most prominent feature is the presence of (2 x n) rec
Publikováno v:
Journal of Applied Crystallography. 36:1432-1439
A Michelson interferometer for X-rays of wavelength ∼1 Å has been proposed to test the temporal coherence of FEL radiation. Such a device has been made at HASYLAB from a silicon single crystal. It is based on the BBB interferometer of Bonse and Ha
Publikováno v:
Optics Communications. 209:273-277
A theory of atom resolving X-ray fluorescence holography is presented. It uses the single-scattering approach to derive from Maxwell's equations a solution for imaging electron charge density distribution from the observed X-ray holography data. Expe
Autor:
Larc Tröger, Christian Reckleben, Peter Kappen, Bjerne S. Clausen, Jan-Dierk Grunwaldt, Karsten Hansen, Gerhard Materlik
Publikováno v:
Journal of Synchrotron Radiation. 9:246-253
A silicon drift detector (SDD) was used for ex situ and time-resolved in situ fluorescence X-ray absorption fine structure (XAFS) on low-concentrated catalyst samples. For a single-element and a seven-element SDD the energy resolution and the peak-to
Publikováno v:
Surface Science. :381-388
In this paper we investigate minority adsorption sites on Cl/Si(1 1 1)-(1 � 1) with the X-ray standing wave technique. By a combination with X-ray photon stimulated desorption,we show that the coordinates of the desorption-active chlorine minority
Publikováno v:
Applied Physics A Materials Science & Processing. 73:265-271
MgO (100) single crystals are implanted with 1.50-MeV Al+ and 3.00-MeV Al2 + ions at a fluence of 1×1015 Al atoms cm-2 under high-vacuum conditions. The surface morphology of the substrate is measured in air using atomic force microscopy and X-ray r
Autor:
Lothar Strüder, Larc Tröger, Peter Kappen, Karsten Hansen, Gerhard Materlik, Peter Lechner, Ch. Reckleben
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. :1163-1166
Spatially resolved spectroscopic measurements with a 10 and 20 μm pencil beam have been performed on a monolithic 7-element Silicon-Drift-Detector (SDD). Detailed studies are shown of the modification of the spectroscopic response at pixel edges and
Publikováno v:
Journal of Synchrotron Radiation. 8:105-109
Experimental data are presented which demonstrate the existence of a fine structure in extended X-ray absorption spectra due to interference effects in the initial photon state (πXAFS). Interference occurs between the incident electromagnetic wave a
Autor:
Gerhard Materlik
Publikováno v:
Nature Materials. 9:375-377
Coherent synchrotron radiation has revolutionized the study of molecules and materials. Talking to Nature Materials, Gerhard Materlik, CEO of the Diamond Light Source, discusses the many uses of synchrotron sources and free electron lasers.
Publikováno v:
Applied Surface Science. 166:399-405
We have used Bi as a surfactant in Ge growth on Si(111) and present a detailed analysis of the adsorption site geometry of Bi on bare Si(111) as well as on ultrathin Ge films (1–2 monolayers, ML) grown on Bi-terminated Si(111). X-ray standing waves