Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Gergö Letay"'
Publikováno v:
Progress in Photovoltaics: Research and Applications. 16:409-418
This work presents efforts to simulate numerically the current voltage (IV) curve of a III–V based Esaki tunnel diode. Using a tunneling model, which takes into account the full nonlocality of the barrier, a good agreement between measured and simu
Publikováno v:
2008 33rd IEEE Photovoltaic Specialists Conference.
In order to connect individual subcells in monolithically grown multi-junction solar cells Esaki interband tunnel diodes are widely used. In this work, numerical simulations of an isolated III–V Esaki tunnel diode and of a dual-junction solar cell
In this letter a calibrated numerical model of a III–V dual-junction solar cell including tunnel diode and Bragg reflector is presented. The quantum efficiencies of the subcells are computed by using the principle of current-limitation in monolithi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a0d94a3ba5f5d30787fc973fab1b86f5
https://publica.fraunhofer.de/handle/publica/216311
https://publica.fraunhofer.de/handle/publica/216311
Autor:
Gergö Letay, Wei-Choon Ng
Publikováno v:
Light-Emitting Diodes: Research, Manufacturing, and Applications XI.
We report new capabilities in our Sentaurus-Device 1 simulator for modeling arbitrarily shaped 2D/3D white LEDs by coupling novel photon recycling, luminescent spectral conversion effects and electrical transport self consistently. In our simulator,
Publikováno v:
Light-Emitting Diodes: Research, Manufacturing, and Applications XI.
This paper illustrates how technology computer-aided design (TCAD), which nowadays is an essential part of CMOS technology, can be applied to LED development and manufacturing. In the first part, the essential electrical and optical models inherent t
Autor:
Rafael Santschi, Bernd Witzigmann, Sven Eitel, Franck Nallet, Hektor Meier, Stefan Odermatt, Gergö Letay
Publikováno v:
SPIE Proceedings.
Electrostatic Discharge (ESD) events can cause irreversible damage during production, packaging and application of Vertical-Cavity Surface Emitting Lasers (VCSELs). Experimental investigation of those damage patterns inside a real device is a complex