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pro vyhledávání: '"Gerard van Veen"'
Autor:
Hugh T. Philipp, Mark W. Tate, Katherine S. Shanks, Luigi Mele, Maurice Peemen, Pleun Dona, Reinout Hartong, Gerard van Veen, Yu-Tsun Shao, Zhen Chen, Julia Thom-Levy, David A. Muller, Sol M. Gruner
Publikováno v:
Microscopy and Microanalysis
Precision and accuracy of quantitative scanning transmission electron microscopy (STEM) methods such as ptychography, and the mapping of electric, magnetic, and strain fields depend on the dose. Reasonable acquisition time requires high beam current
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eda31d00f9791ea2043b3457dc4d04d6
