Zobrazeno 1 - 1
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pro vyhledávání: '"Georgiy Svechnikov"'
Publikováno v:
Semiconductor physics, quantum electronics and optoelectronics. 12:173-177
The reliability of AC thick-film EL devices has been studied. The AC thick- film EL devices were fabricated by Novatech Inc. using the industrial print screen technology. The analysis of reasons for failure has been proposed. The dependence of EL lam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9103b501d448ab087dcc8babb3f71165
https://doi.org/10.15407/spqeo12.02.173
https://doi.org/10.15407/spqeo12.02.173
