Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Georges Falessi"'
Publikováno v:
Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130).
Simple microeconomic models that directly link metrology, yield, and profitability are rare or non-existent. In this work, we introduce and validate such a model. Using a small number of input parameters, we explain current yield management practices
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8d2b0b3fc6f57a48313e761c586f784
https://doi.org/10.1109/issm.2000.993615
https://doi.org/10.1109/issm.2000.993615
Autor:
Xuemei Chen, Ady Levy, Michael D. Slessor, Georges Falessi, Amir Lev, Matt Hankinson, Kevin M. Monahan, Craig Garvin
Publikováno v:
SPIE Proceedings.
Fundamentally, advanced process control enables accelerated design-rule reduction, but simple microeconomic models that directly link the effects of advanced process control to profitability are rare or non-existent. In this work, we derive these lin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b786a32439adf55fa45114ab1e5a4422
https://doi.org/10.1117/12.473503
https://doi.org/10.1117/12.473503
Publikováno v:
SPIE Proceedings.
Simple microeconomic models that directly link metrology, yield, and profitability are rare or non-existent. In this work, we validate and apply such a model. Using a small number of input parameters, we explain current yield management practices in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6606617a8ad7c853b2c76075f1bafbef
https://doi.org/10.1117/12.436774
https://doi.org/10.1117/12.436774
Conference
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