Zobrazeno 1 - 8
of 8
pro vyhledávání: '"George W. Mattson"'
Autor:
Kyle T. Vogt, Christopher E. Malmberg, Jacob C. Buchanan, George W. Mattson, G. Mirek Brandt, Dylan B. Fast, Paul H.-Y. Cheong, John F. Wager, Matt W. Graham
Publikováno v:
Physical Review Research, Vol 2, Iss 3, p 033358 (2020)
The subgap density of states of amorphous indium gallium zinc oxide (a-IGZO) is obtained using the ultrabroadband photoconduction response of thin-film transistors (TFTs). Density-functional theory simulations classify the origin of the measured subg
Externí odkaz:
https://doaj.org/article/d5e5868446bb459d932299954c102e52
Publikováno v:
ECS Transactions. 97:339-357
Amorphous oxide thin-film transistors (TFTs) have provided a new route to transparent, low power consumption, large-area display technology. The properties of these thin films are crucially dependent on material composition and process variations whi
Publikováno v:
Advanced Functional Materials. :2300742
Under varying growth and device processing conditions, ultrabroadband photoconduction (UBPC) reveals strongly evolving trends in the defect density of states (DoS) for amorphous oxide semiconductor thin-film transistors (TFTs). Spanning the wide band
Within the subgap of amorphous oxide semiconductors like amorphous indium gallium zinc oxide (a-IGZO) are donor-like and acceptor-like states that control the operational physics of optically transparent thin-film transistors (TFTs). Hydrogen incorpo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2b5da1b4e018b5c361be4a846b9fe6bd
http://arxiv.org/abs/2111.08588
http://arxiv.org/abs/2111.08588
Autor:
John F. Wager, Dylan B. Fast, Kyle T. Vogt, G. Mirek Brandt, Christopher E. Malmberg, George W. Mattson, Matt W. Graham, Paul Ha-Yeon Cheong, Jacob C. Buchanan
Publikováno v:
Physical Review Research. 2
The sub-gap density of states of amorphous indium gallium zinc oxide ($a$-IGZO) is obtained using the ultrabroadband photoconduction (UBPC) response of thin-film transistors (TFTs). Density functional theory simulations classify the origin of the mea
Publikováno v:
Quantum Sensing and Nano Electronics and Photonics XVII.
Autor:
John F. Wager, Matt W. Graham, Paul Ha-Yeon Cheong, George W. Mattson, Christopher E. Malmberg, Kyle T. Vogt
Publikováno v:
Oxide-based Materials and Devices XI.
Amorphous semiconducting transparent oxides like InGaZnO4 (a-IGZO) have a broad distribution of metal and oxygen vacancy defects that determine thin film transistor (TFT) characteristics and impact device reliability metrics such as hysteresis. Here,
Hydrogen Incorporation Modulates Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors
Publikováno v:
ECS Meeting Abstracts. :1079-1079
Incorporation of hydrogen into the channel layer of an amorphous indium gallium zinc oxide (a-IGZO) thin-film transistor leads to a negative shift in the transfer curve threshold voltage; the magnitude of the threshold voltage shift increases with in